VLSI Test Symposium, 21st IEEE.
| Author | : IEEE Computer Society Staff |
| Publisher | : |
| Total Pages | : |
| Release | : 2003 |
| Genre | : |
| ISBN | : |
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Vlsi Test Symposium 21st Ieee
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21st IEEE VLSI Test Symposium
| Author | : |
| Publisher | : IEEE |
| Total Pages | : 432 |
| Release | : 2003-01-01 |
| Genre | : Technology & Engineering |
| ISBN | : 9780769519241 |
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VTS 2003 is the twenty-first in a series of annual symposia that explore the state-of-the-art, and introduce innovative approaches, in the testing of electronic circuits and systems. The complexity of current generation ICs, combined with rapidly developing high density, high speed packaging and reduced design cycle time, has made it extremely difficult and expensive to comprehensively test electronic systems, and diagnose failed parts using traditional methods. This situation worsens as we move toward nanometer technologies.
VLSI Test Symposium (VTS, `98), 16th IEEE.
| Author | : IEEE, Society Staff |
| Publisher | : |
| Total Pages | : |
| Release | : 1998 |
| Genre | : |
| ISBN | : |
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16th IEEE VLSI Test Symposium
| Author | : |
| Publisher | : |
| Total Pages | : 520 |
| Release | : 1998 |
| Genre | : Application-specific integrated circuits |
| ISBN | : 9780818684364 |
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Proceedings
| Author | : Ieee |
| Publisher | : Institute of Electrical & Electronics Engineers(IEEE) |
| Total Pages | : 468 |
| Release | : 2004 |
| Genre | : Technology & Engineering |
| ISBN | : 9780769521343 |
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The proceedings of the 21st IEEE VLSI test symposium (VTS (2003) describing innovations in the testing of integrated circuits and systems.
Special Issue on 16th IEEE VLSI Test Symposium (VTS 98)
| Author | : VLSI Test Symposium |
| Publisher | : |
| Total Pages | : |
| Release | : 1999 |
| Genre | : |
| ISBN | : |
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VLSI Design and Test
| Author | : Brajesh Kumar Kaushik |
| Publisher | : Springer |
| Total Pages | : 820 |
| Release | : 2017-12-21 |
| Genre | : Computers |
| ISBN | : 9811074704 |
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This book constitutes the refereed proceedings of the 21st International Symposium on VLSI Design and Test, VDAT 2017, held in Roorkee, India, in June/July 2017. The 48 full papers presented together with 27 short papers were carefully reviewed and selected from 246 submissions. The papers were organized in topical sections named: digital design; analog/mixed signal; VLSI testing; devices and technology; VLSI architectures; emerging technologies and memory; system design; low power design and test; RF circuits; architecture and CAD; and design verification.
IEEE VLSI Test Symposium
| Author | : |
| Publisher | : |
| Total Pages | : 498 |
| Release | : 2005 |
| Genre | : Application-specific integrated circuits |
| ISBN | : |
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2021 IEEE 39th VLSI Test Symposium (VTS)
| Author | : Alberto Basio |
| Publisher | : |
| Total Pages | : 0 |
| Release | : 2021 |
| Genre | : Integrated circuits |
| ISBN | : 9781665419499 |
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2017 IEEE 35th VLSI Test Symposium (VTS).
| Author | : |
| Publisher | : |
| Total Pages | : |
| Release | : 2017 |
| Genre | : |
| ISBN | : 9781509044825 |
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