Semiconductor Reliability Handbook
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Author | : Osamu Ueda |
Publisher | : Springer Science & Business Media |
Total Pages | : 618 |
Release | : 2012-09-24 |
Genre | : Technology & Engineering |
ISBN | : 1461443369 |
Download Materials and Reliability Handbook for Semiconductor Optical and Electron Devices Book in PDF, Epub and Kindle
Materials and Reliability Handbook for Semiconductor Optical and Electron Devices provides comprehensive coverage of reliability procedures and approaches for electron and photonic devices. These include lasers and high speed electronics used in cell phones, satellites, data transmission systems and displays. Lifetime predictions for compound semiconductor devices are notoriously inaccurate due to the absence of standard protocols. Manufacturers have relied on extrapolation back to room temperature of accelerated testing at elevated temperature. This technique fails for scaled, high current density devices. Device failure is driven by electric field or current mechanisms or low activation energy processes that are masked by other mechanisms at high temperature. The Handbook addresses reliability engineering for III-V devices, including materials and electrical characterization, reliability testing, and electronic characterization. These are used to develop new simulation technologies for device operation and reliability, which allow accurate prediction of reliability as well as the design specifically for improved reliability. The Handbook emphasizes physical mechanisms rather than an electrical definition of reliability. Accelerated aging is useful only if the failure mechanism is known. The Handbook also focuses on voltage and current acceleration stress mechanisms.
Author | : A. Christou |
Publisher | : Springer Science & Business Media |
Total Pages | : 571 |
Release | : 2012-12-06 |
Genre | : Technology & Engineering |
ISBN | : 9400924828 |
Download Semiconductor Device Reliability Book in PDF, Epub and Kindle
This publication is a compilation of papers presented at the Semiconductor Device Reliabi lity Workshop sponsored by the NATO International Scientific Exchange Program. The Workshop was held in Crete, Greece from June 4 to June 9, 1989. The objective of the Workshop was to review and to further explore advances in the field of semiconductor reliability through invited paper presentations and discussions. The technical emphasis was on quality assurance and reliability of optoelectronic and high speed semiconductor devices. The primary support for the meeting was provided by the Scientific Affairs Division of NATO. We are indebted to NATO for their support and to Dr. Craig Sinclair, who admin isters this program. The chapters of this book follow the format and order of the sessions of the meeting. Thirty-six papers were presented and discussed during the five-day Workshop. In addi tion, two panel sessions were held, with audience participation, where the particularly controversial topics of bum-in and reliability modeling and prediction methods were dis cussed. A brief review of these sessions is presented in this book.
Author | : National Semiconductor Corporation |
Publisher | : |
Total Pages | : 890 |
Release | : 1979 |
Genre | : Electronics in military engineering |
ISBN | : |
Download The Reliability Handbook Book in PDF, Epub and Kindle
Author | : Osamu Ueda |
Publisher | : Springer Science & Business Media |
Total Pages | : 618 |
Release | : 2012-09-22 |
Genre | : Science |
ISBN | : 1461443377 |
Download Materials and Reliability Handbook for Semiconductor Optical and Electron Devices Book in PDF, Epub and Kindle
Materials and Reliability Handbook for Semiconductor Optical and Electron Devices provides comprehensive coverage of reliability procedures and approaches for electron and photonic devices. These include lasers and high speed electronics used in cell phones, satellites, data transmission systems and displays. Lifetime predictions for compound semiconductor devices are notoriously inaccurate due to the absence of standard protocols. Manufacturers have relied on extrapolation back to room temperature of accelerated testing at elevated temperature. This technique fails for scaled, high current density devices. Device failure is driven by electric field or current mechanisms or low activation energy processes that are masked by other mechanisms at high temperature. The Handbook addresses reliability engineering for III-V devices, including materials and electrical characterization, reliability testing, and electronic characterization. These are used to develop new simulation technologies for device operation and reliability, which allow accurate prediction of reliability as well as the design specifically for improved reliability. The Handbook emphasizes physical mechanisms rather than an electrical definition of reliability. Accelerated aging is useful only if the failure mechanism is known. The Handbook also focuses on voltage and current acceleration stress mechanisms.
Author | : National Semiconductor Corporation |
Publisher | : |
Total Pages | : 275 |
Release | : 1979 |
Genre | : |
ISBN | : |
Download Reliability Handbook Book in PDF, Epub and Kindle
Author | : Zhenghao Gan |
Publisher | : McGraw Hill Professional |
Total Pages | : 624 |
Release | : 2012-10-10 |
Genre | : Technology & Engineering |
ISBN | : 007175427X |
Download Semiconductor Process Reliability in Practice Book in PDF, Epub and Kindle
Proven processes for ensuring semiconductor device reliability Co-written by experts in the field, Semiconductor Process Reliability in Practice contains detailed descriptions and analyses of reliability and qualification for semiconductor device manufacturing and discusses the underlying physics and theory. The book covers initial specification definition, test structure design, analysis of test structure data, and final qualification of the process. Real-world examples of test structure designs to qualify front-end-of-line devices and back-end-of-line interconnects are provided in this practical, comprehensive guide. Coverage includes: Basic device physics Process flow for MOS manufacturing Measurements useful for device reliability characterization Hot carrier injection Gate-oxide integrity (GOI) and time-dependent dielectric breakdown (TDDB) Negative bias temperature instability Plasma-induced damage Electrostatic discharge protection of integrated circuits Electromigration Stress migration Intermetal dielectric breakdown
Author | : Michael Pecht |
Publisher | : CRC Press |
Total Pages | : 228 |
Release | : 2017-11-22 |
Genre | : Technology & Engineering |
ISBN | : 1351443569 |
Download Guidebook for Managing Silicon Chip Reliability Book in PDF, Epub and Kindle
Achieving cost-effective performance over time requires an organized, disciplined, and time-phased approach to product design, development, qualification, manufacture, and in-service management. Guidebook for Managing Silicon Chip Reliability examines the principal failure mechanisms associated with modern integrated circuits and describes common practices used to resolve them. This quick reference on semiconductor reliability addresses the key question: How will the understanding of failure mechanisms affect the future? Chapters discuss: failure sites, operational loads, and failure mechanism intrinsic device sensitivities electromigration hot carrier aging time dependent dielectric breakdown mechanical stress induced migration alpha particle sensitivity electrostatic discharge (ESD) and electrical overstress latch-up qualification screening guidelines for designing reliability Guidebook for Managing Silicon Chip Reliability focuses on device failure and causes throughout - providing a thorough framework on how to model the mechanism, test for defects, and avoid and manage damage. It will serve as an exceptional resource for electrical engineers as well as mechanical engineers working in the field of electronic packaging.
Author | : Shahrzad Salemi |
Publisher | : RIAC |
Total Pages | : 271 |
Release | : 2008 |
Genre | : Electronic apparatus and appliances |
ISBN | : 1933904291 |
Download Physics-of-Failure Based Handbook of Microelectronic Systems Book in PDF, Epub and Kindle
Author | : National Semiconductor Corporation |
Publisher | : |
Total Pages | : 286 |
Release | : 1982 |
Genre | : |
ISBN | : |
Download The Reliability Handbook Book in PDF, Epub and Kindle
Author | : Shāpu Kabushiki Kaisha |
Publisher | : |
Total Pages | : |
Release | : 1991 |
Genre | : Integrated circuits |
ISBN | : |
Download Sharp Semiconductor Reliability Handbook Book in PDF, Epub and Kindle