Semiconductor Devices in Harsh Conditions

Semiconductor Devices in Harsh Conditions
Author: Kirsten Weide-Zaage
Publisher: CRC Press
Total Pages: 257
Release: 2016-11-25
Genre: Technology & Engineering
ISBN: 149874382X

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This book introduces the reader to a number of challenges for the operation of electronic devices in various harsh environmental conditions. While some chapters focus on measuring and understanding the effects of these environments on electronic components, many also propose design solutions, whether in choice of material, innovative structures, or strategies for amelioration and repair. Many applications need electronics designed to operate in harsh environments. Readers will find, in this collection of topics, tools and ideas useful in their own pursuits and of interest to their intellectual curiosity. With a focus on radiation, operating conditions, sensor systems, package, and system design, the book is divided into three parts. The first part deals with sensing devices designed for operating in the presence of radiation, commercials of the shelf (COTS) products for space computing, and influences of single event upset. The second covers system and package design for harsh operating conditions. The third presents devices for biomedical applications under moisture and temperature loads in the frame of sensor systems and operating conditions.

Harsh Environment Electronics

Harsh Environment Electronics
Author: Ahmed Sharif
Publisher: John Wiley & Sons
Total Pages: 398
Release: 2019-08-05
Genre: Technology & Engineering
ISBN: 3527344195

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Provides in-depth knowledge on novel materials that make electronics work under high-temperature and high-pressure conditions This book reviews the state of the art in research and development of lead-free interconnect materials for electronic packaging technology. It identifies the technical barriers to the development and manufacture of high-temperature interconnect materials to investigate into the complexities introduced by harsh conditions. It teaches the techniques adopted and the possible alternatives of interconnect materials to cope with the impacts of extreme temperatures for implementing at industrial scale. The book also examines the application of nanomaterials, current trends within the topic area, and the potential environmental impacts of material usage. Written by world-renowned experts from academia and industry, Harsh Environment Electronics: Interconnect Materials and Performance Assessment covers interconnect materials based on silver, gold, and zinc alloys as well as advanced approaches utilizing polymers and nanomaterials in the first section. The second part is devoted to the performance assessment of the different interconnect materials and their respective environmental impact. -Takes a scientific approach to analyzing and addressing the issues related to interconnect materials involved in high temperature electronics -Reviews all relevant materials used in interconnect technology as well as alternative approaches otherwise neglected in other literature -Highlights emergent research and theoretical concepts in the implementation of different materials in soldering and die-attach applications -Covers wide-bandgap semiconductor device technologies for high temperature and harsh environment applications, transient liquid phase bonding, glass frit based die attach solution for harsh environment, and more -A pivotal reference for professionals, engineers, students, and researchers Harsh Environment Electronics: Interconnect Materials and Performance Assessment is aimed at materials scientists, electrical engineers, and semiconductor physicists, and treats this specialized topic with breadth and depth.

Science and Technology of Semiconductor-On-Insulator Structures and Devices Operating in a Harsh Environment

Science and Technology of Semiconductor-On-Insulator Structures and Devices Operating in a Harsh Environment
Author: Denis Flandre
Publisher: Springer Science & Business Media
Total Pages: 358
Release: 2006-05-06
Genre: Technology & Engineering
ISBN: 1402030134

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This proceedings volume archives the contributions of the speakers who attended the NATO Advanced Research Workshop on “Science and Technology of Semiconductor-On-Insulator Structures and Devices Operating in a Harsh Environment” held at the Sanatorium Puscha Ozerna, th th Kyiv, Ukraine, from 25 to 29 April 2004. The semiconductor industry has maintained a very rapid growth during the last three decades through impressive technological achievements which have resulted in products with higher performance and lower cost per function. After many years of development semiconductor-on-insulator materials have entered volume production and will increasingly be used by the manufacturing industry. The wider use of semiconductor (especially silicon) on insulator materials will not only enable the benefits of these materials to be further demonstrated but, also, will drive down the cost of substrates which, in turn, will stimulate the development of other novel devices and applications. In itself this trend will encourage the promotion of the skills and ideas generated by researchers in the Former Soviet Union and Eastern Europe and their incorporation in future collaborations.

Progress in SOI Structures and Devices Operating at Extreme Conditions

Progress in SOI Structures and Devices Operating at Extreme Conditions
Author: Francis Balestra
Publisher: Springer Science & Business Media
Total Pages: 349
Release: 2012-12-06
Genre: Technology & Engineering
ISBN: 9401003394

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A review of the electrical properties, performance and physical mechanisms of the main silicon-on-insulator (SOI) materials and devices. Particular attention is paid to the reliability of SOI structures operating in harsh conditions. The first part of the book deals with material technology and describes the SIMOX and ELTRAN technologies, the smart-cut technique, SiCOI structures and MBE growth. The second part covers reliability of devices operating under extreme conditions, with an examination of low and high temperature operation of deep submicron MOSFETs and novel SOI technologies and circuits, SOI in harsh environments and the properties of the buried oxide. The third part deals with the characterization of advanced SOI materials and devices, covering laser-recrystallized SOI layers, ultrashort SOI MOSFETs and nanostructures, gated diodes and SOI devices produced by a variety of techniques. The last part reviews future prospects for SOI structures, analyzing wafer bonding techniques, applications of oxidized porous silicon, semi-insulating silicon materials, self-organization of silicon dots and wires on SOI and some new physical phenomena.

Extreme-temperature and Harsh-environment Electronics

Extreme-temperature and Harsh-environment Electronics
Author: Vinod Kumar Khanna
Publisher:
Total Pages: 0
Release: 2017
Genre: Circuits
ISBN: 9780750311571

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"Electronic devices and circuits are employed by a range of industries in testing conditions from extremes of high- or low-temperature, in chemically corrosive environments, subject to shock and vibration or exposure to radiation. This book describes the diverse measures necessary to make electronics capable of coping with such situations as well as to gainfully exploit any new phenomena that take place only under these conditions."--Prové de l'editor.

Extreme Environment Electronics

Extreme Environment Electronics
Author: John D. Cressler
Publisher: CRC Press
Total Pages: 1041
Release: 2017-12-19
Genre: Technology & Engineering
ISBN: 143987431X

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Unfriendly to conventional electronic devices, circuits, and systems, extreme environments represent a serious challenge to designers and mission architects. The first truly comprehensive guide to this specialized field, Extreme Environment Electronics explains the essential aspects of designing and using devices, circuits, and electronic systems intended to operate in extreme environments, including across wide temperature ranges and in radiation-intense scenarios such as space. The Definitive Guide to Extreme Environment Electronics Featuring contributions by some of the world’s foremost experts in extreme environment electronics, the book provides in-depth information on a wide array of topics. It begins by describing the extreme conditions and then delves into a description of suitable semiconductor technologies and the modeling of devices within those technologies. It also discusses reliability issues and failure mechanisms that readers need to be aware of, as well as best practices for the design of these electronics. Continuing beyond just the "paper design" of building blocks, the book rounds out coverage of the design realization process with verification techniques and chapters on electronic packaging for extreme environments. The final set of chapters describes actual chip-level designs for applications in energy and space exploration. Requiring only a basic background in electronics, the book combines theoretical and practical aspects in each self-contained chapter. Appendices supply additional background material. With its broad coverage and depth, and the expertise of the contributing authors, this is an invaluable reference for engineers, scientists, and technical managers, as well as researchers and graduate students. A hands-on resource, it explores what is required to successfully operate electronics in the most demanding conditions.

Harsh Environment Electronics

Harsh Environment Electronics
Author: Ahmed Sharif
Publisher: John Wiley & Sons
Total Pages: 400
Release: 2019-03-19
Genre: Technology & Engineering
ISBN: 3527813993

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Provides in-depth knowledge on novel materials that make electronics work under high-temperature and high-pressure conditions This book reviews the state of the art in research and development of lead-free interconnect materials for electronic packaging technology. It identifies the technical barriers to the development and manufacture of high-temperature interconnect materials to investigate into the complexities introduced by harsh conditions. It teaches the techniques adopted and the possible alternatives of interconnect materials to cope with the impacts of extreme temperatures for implementing at industrial scale. The book also examines the application of nanomaterials, current trends within the topic area, and the potential environmental impacts of material usage. Written by world-renowned experts from academia and industry, Harsh Environment Electronics: Interconnect Materials and Performance Assessment covers interconnect materials based on silver, gold, and zinc alloys as well as advanced approaches utilizing polymers and nanomaterials in the first section. The second part is devoted to the performance assessment of the different interconnect materials and their respective environmental impact. -Takes a scientific approach to analyzing and addressing the issues related to interconnect materials involved in high temperature electronics -Reviews all relevant materials used in interconnect technology as well as alternative approaches otherwise neglected in other literature -Highlights emergent research and theoretical concepts in the implementation of different materials in soldering and die-attach applications -Covers wide-bandgap semiconductor device technologies for high temperature and harsh environment applications, transient liquid phase bonding, glass frit based die attach solution for harsh environment, and more -A pivotal reference for professionals, engineers, students, and researchers Harsh Environment Electronics: Interconnect Materials and Performance Assessment is aimed at materials scientists, electrical engineers, and semiconductor physicists, and treats this specialized topic with breadth and depth.

Thermal Reliability of Power Semiconductor Device in the Renewable Energy System

Thermal Reliability of Power Semiconductor Device in the Renewable Energy System
Author: Xiong Du
Publisher: Springer Nature
Total Pages: 184
Release: 2022-07-08
Genre: Technology & Engineering
ISBN: 9811931321

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This book focuses on the thermal reliability of power semiconductor device by looking at the failure mechanism, thermal parameters monitoring, junction temperature estimation, lifetime evaluation, and thermal management. Theoretical analysis and experimental tests are presented to explain existing reliability improvement techniques. This book is a valuable reference for the students and researchers who pay attention to the thermal reliability design of power semiconductor device.

Modern Nanotechnology

Modern Nanotechnology
Author: Junaid Ahmad Malik
Publisher: Springer Nature
Total Pages: 682
Release: 2023-07-18
Genre: Technology & Engineering
ISBN: 3031311116

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This two-volume set provides a comprehensive overview of modern nanoscience, and encompasses advanced techniques of nanocomposite materials that make their way from the laboratory to the field for the revival of energy and environmental systems in a sustainable manner. It includes the design and the sophisticated fabrication of nanomaterials along with their potential energy and environmental applications, while looking at how nanoscience and nanotechnology can be used to promote environmentally friendly processes and strategies. The books' purpose is to promote eco-friendly methods and techniques by covering many elements of both the synthesis and uses of nanoparticles and nanofluids for energy and environmental engineering. They provide an up-to-date synthesis of nanocomposite materials for modern nanotechnology applications in the fields of environment protection, heterogeneous catalysis, wastewater treatment, fuel cells, electrochemical energy conversion, and storage applications. The set is designed for environmental scientists, nanotechnologists, chemists, engineers, and individuals seeking current research on nanotechnology and its applications in environmental engineering. Graduate students working in these fields will also find it a valuable resource. Volume 1 focuses on the fundamentals of nanotechnology, environmental protection, sustainable agriculture, bioremediation, bio-nanocomposites, and wastewater treatment.

International Youth Conference on Electronics, Telecommunications and Information Technologies

International Youth Conference on Electronics, Telecommunications and Information Technologies
Author: Elena Velichko
Publisher: Springer Nature
Total Pages: 743
Release: 2020-11-27
Genre: Science
ISBN: 3030588688

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This volume presents peer reviewed and selected papers of the International Youth Conference on Electronics, Telecommunications and Information Technologies (YETI-2020), held in Peter the Great St. Petersburg Polytechnic University, St. Petersburg on July 10–11, 2020. It discusses current trends and major advances in electronics, telecommunications, optical and information technologies, focusing, in particular, on theoretical and practical aspects of developing novel devices and materials, improving data processing methods and technologies. The conference brings together young researchers and early-career scientists participating in a series of lectures and presentations, establishing contacts with potential partners, sharing new project ideas and starting new collaborations.