Semiconductor Defect Engineering: Volume 864

Semiconductor Defect Engineering: Volume 864
Author: S. Ashok
Publisher: Cambridge University Press
Total Pages: 630
Release: 2014-06-05
Genre: Technology & Engineering
ISBN: 9781107408975

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This book, first published in 2005, explores the deliberate introduction and manipulation of defects and impurities for the purpose of engineering desired properties in semiconductor materials and devices. The presentations are grouped around the distinct topics of materials, processing and devices. The papers on grown-in defects in bulk crystals deal with overviews of intrinsic and impurity-related defects and their influence on electrical, optical and mechanical properties, as well as the use of impurities to arrest certain types of defects during growth and defects to control growth. Most of the papers deal with dopant and defect issues relevant to widegap semiconductors. The scope of defect and impurity engineering is far-ranging, as exemplified by phase and morphological stability of silicides, interface control and passivation, and application of ion implantation, plasma treatment and rapid thermal processing for creating/activating/suppressing trap levels. Papers in these areas are also found in the book.

Semiconductor Defect Engineering: Volume 864

Semiconductor Defect Engineering: Volume 864
Author: S. Ashok
Publisher: Cambridge University Press
Total Pages: 0
Release: 2005-07-29
Genre: Technology & Engineering
ISBN: 9781558998179

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This book, first published in 2005, explores the deliberate introduction and manipulation of defects and impurities for the purpose of engineering desired properties in semiconductor materials and devices. The presentations are grouped around the distinct topics of materials, processing and devices. The papers on grown-in defects in bulk crystals deal with overviews of intrinsic and impurity-related defects and their influence on electrical, optical and mechanical properties, as well as the use of impurities to arrest certain types of defects during growth and defects to control growth. Most of the papers deal with dopant and defect issues relevant to widegap semiconductors. The scope of defect and impurity engineering is far-ranging, as exemplified by phase and morphological stability of silicides, interface control and passivation, and application of ion implantation, plasma treatment and rapid thermal processing for creating/activating/suppressing trap levels. Papers in these areas are also found in the book.

Semiconductor Defect Engineering: Volume 994

Semiconductor Defect Engineering: Volume 994
Author: S. Ashok
Publisher:
Total Pages: 400
Release: 2007-09-10
Genre: Technology & Engineering
ISBN:

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The MRS Symposium Proceeding series is an internationally recognised reference suitable for researchers and practitioners. This book, first published in 2007, focuses on the application of defects and impurities in current and emerging semiconductor technologies.

Progress in Semiconductor Materials V: Volume 891

Progress in Semiconductor Materials V: Volume 891
Author: Linda J. Olafsen
Publisher:
Total Pages: 672
Release: 2006-06-28
Genre: Science
ISBN:

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The MRS Symposium Proceeding series is an internationally recognised reference suitable for researchers and practitioners.

Thin-Film Compound Semiconductor Photovoltaics: Volume 865

Thin-Film Compound Semiconductor Photovoltaics: Volume 865
Author: Materials Research Society. Meeting
Publisher:
Total Pages: 580
Release: 2005-11-09
Genre: Technology & Engineering
ISBN:

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The MRS Symposium Proceeding series is an internationally recognised reference suitable for researchers and practitioners.

Defect and Impurity Engineered Semiconductors and Devices III: Volume 719

Defect and Impurity Engineered Semiconductors and Devices III: Volume 719
Author: S. Ashok
Publisher:
Total Pages: 522
Release: 2002-08-09
Genre: Technology & Engineering
ISBN:

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This book focuses on the deliberate introduction and manipulation of defects and impurities in order to engineer desired properties in semiconductor materials and devices. In view of current exciting developments in wide-bandgap semiconductors like GaN for blue light emission, as well as high-speed and high-temperature electronics, dopant and defect issues relevant to these materials are addressed. Also featured are semiconductor nanocavities and nano-structures, with emphasis on the formation and impact of vacancy-type defects. Defect reaction problems pertaining to impurity gettering, precipitation and hydrogen passivation are specific examples of defect engineering that improve the electronic quality of the material. A number of papers also deal with characterization techniques needed to study and to identify defects in materials and device structures. Finally, papers also address issues such as interface control and passivation, application of ion implantation, plasma treatment and rapid thermal processing for creating/activating/suppressing trap levels, and device applications.

Degradation Processes in Nanostructured Materials: Volume 887

Degradation Processes in Nanostructured Materials: Volume 887
Author: Materials Research Society. Meeting
Publisher:
Total Pages: 296
Release: 2006-04-07
Genre: Science
ISBN:

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The MRS Symposium Proceeding series is an internationally recognised reference suitable for researchers and practitioners. This book studies the effect of nanometer-scale structure and confinement on degradation processes and analyzes the experimental and theoretical approaches used to estimate the lifetime of nanostructured and nanoconfined materials in various environments.

Surface Engineering for Manufacturing Applications: Volume 890

Surface Engineering for Manufacturing Applications: Volume 890
Author: Materials Research Society
Publisher:
Total Pages: 336
Release: 2006-03-28
Genre: Technology & Engineering
ISBN:

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Surface interactions and modifications have become increasingly critical for a broad range of manufacturing technologies. Applications can be in traditional manufacturing sectors and in manufacturing processes for microelectronics, optics, and micro-/nanoelectromechanical systems (MEMS/NEMS). Many applications demand engineered surfaces at different length scales that will function under extreme conditions. The goal of this book is to advance understanding of these diverse applications. In the field of tribological coatings, the increasing sophistication of coating processes to provide control over materials and composition gradients is being exploited to tailor properties such as adhesion, stresses, thermal barrier and wear resistance. Understanding the influence of nanostructure in coatings has become pivotal in the development of hard and wear-resistant materials. Modeling and simulation continue to make contributions to the understanding and predication of surface properties and surface interactions. Advances in this field have focused on the microstructure and organization of organic thin films. In tribology, the combination of modeling, with experimental probe techniques, is increasing our understanding of erosion and wear mechanisms.

Amorphous and Nanocrystalline Silicon Science and Technology 2005: Volume 862

Amorphous and Nanocrystalline Silicon Science and Technology 2005: Volume 862
Author: Robert W. Collins
Publisher:
Total Pages: 760
Release: 2005-09-30
Genre: Technology & Engineering
ISBN:

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This book continues the long-standing and highly successful series on amorphous silicon science and technology. The opening article honors the pioneering use of photons to probe silicon films and provides an historical overview of optical absorption for studies of the Urbach edge and disorder. Additional invited presentations focus on new approaches for the fabrication of higher stability amorphous silicon-based materials and solar cells, and on the characterization of materials and cells both structurally and electronically. The book includes topics relevant to solar cells, including the role of hydrogen in metastability phenomena and deposition processes, and the application of atomistic material simulations in elucidating film growth mechanisms and structure as characterized by in situ probes. Chapters are devoted to nanostructures, such as quantum dots and wires, and to nano/microcrystalline and poly/single crystalline films, the latter involving new concepts in crystalline grain growth and epitaxy. Device applications are also highlighted, such as thin-film transistors, solar cells, and image sensors, operable on the meter scale, to memories, operable on the nanometer scale.

Micro- and Nanosystems: Volume 872

Micro- and Nanosystems: Volume 872
Author: Materials Research Society. Meeting
Publisher:
Total Pages: 552
Release: 2005-11-08
Genre: Technology & Engineering
ISBN:

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The MRS Symposium Proceeding series is an internationally recognised reference suitable for researchers and practitioners.