Real-time Synchrotron X-ray Studies of III-V Nitride Growth

Real-time Synchrotron X-ray Studies of III-V Nitride Growth
Author: Yiyi Wang
Publisher:
Total Pages: 131
Release: 2007
Genre:
ISBN: 9781109976786

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A unique ultra-high vacuum growth chamber for these experiments was designed and constructed by our group. I have set up and optimized the system for thin film growth by molecular beam epitaxy. The real-time x-ray studies facility consists of a base diffractometer and an ultra-high vacuum chamber with processing and analysis instrumentation.

Dilute III-V Nitride Semiconductors and Material Systems

Dilute III-V Nitride Semiconductors and Material Systems
Author: Ayse Erol
Publisher: Springer Science & Business Media
Total Pages: 607
Release: 2008-01-12
Genre: Technology & Engineering
ISBN: 3540745297

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This book reviews the current status of research and development in dilute III-V nitrides. It covers major developments in this new class of materials within 24 chapters from prominent research groups. The book integrates materials science and applications in optics and electronics in a unique way. It is valuable both as a reference work for researchers and as a study text for graduate students.

Research in Progress

Research in Progress
Author:
Publisher:
Total Pages: 274
Release: 1991
Genre: Military research
ISBN:

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Handbook of Crystal Growth

Handbook of Crystal Growth
Author: Tom Kuech
Publisher: Elsevier
Total Pages: 1384
Release: 2014-11-02
Genre: Science
ISBN: 0444633057

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Volume IIIA Basic Techniques Handbook of Crystal Growth, Second Edition Volume IIIA (Basic Techniques), edited by chemical and biological engineering expert Thomas F. Kuech, presents the underpinning science and technology associated with epitaxial growth as well as highlighting many of the chief and burgeoning areas for epitaxial growth. Volume IIIA focuses on major growth techniques which are used both in the scientific investigation of crystal growth processes and commercial development of advanced epitaxial structures. Techniques based on vacuum deposition, vapor phase epitaxy, and liquid and solid phase epitaxy are presented along with new techniques for the development of three-dimensional nano-and micro-structures. Volume IIIB Materials, Processes, and Technology Handbook of Crystal Growth, Second Edition Volume IIIB (Materials, Processes, and Technology), edited by chemical and biological engineering expert Thomas F. Kuech, describes both specific techniques for epitaxial growth as well as an array of materials-specific growth processes. The volume begins by presenting variations on epitaxial growth process where the kinetic processes are used to develop new types of materials at low temperatures. Optical and physical characterizations of epitaxial films are discussed for both in situ and exit to characterization of epitaxial materials. The remainder of the volume presents both the epitaxial growth processes associated with key technology materials as well as unique structures such as monolayer and two dimensional materials. Volume IIIA Basic Techniques Provides an introduction to the chief epitaxial growth processes and the underpinning scientific concepts used to understand and develop new processes. Presents new techniques and technologies for the development of three-dimensional structures such as quantum dots, nano-wires, rods and patterned growth Introduces and utilizes basic concepts of thermodynamics, transport, and a wide cross-section of kinetic processes which form the atomic level text of growth process Volume IIIB Materials, Processes, and Technology Describes atomic level epitaxial deposition and other low temperature growth techniques Presents both the development of thermal and lattice mismatched streams as the techniques used to characterize the structural properties of these materials Presents in-depth discussion of the epitaxial growth techniques associated with silicone silicone-based materials, compound semiconductors, semiconducting nitrides, and refractory materials

Scientific and Technical Aerospace Reports

Scientific and Technical Aerospace Reports
Author:
Publisher:
Total Pages: 456
Release: 1995
Genre: Aeronautics
ISBN:

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Lists citations with abstracts for aerospace related reports obtained from world wide sources and announces documents that have recently been entered into the NASA Scientific and Technical Information Database.

MicroComputed Tomography

MicroComputed Tomography
Author: Stuart R. Stock
Publisher: CRC Press
Total Pages: 390
Release: 2019-12-06
Genre: Technology & Engineering
ISBN: 1498775012

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MicroComputed Tomography has become the gold standard for studying 3D microscopic structures nondestructively, and this book provides up-to-date coverage of the modality. The first part of the book focuses on methodology, covering experimental methods, data analysis, and visualization approaches. Emphasis is on fundamentals so that those new to the field can design their own effective microCT studies. The second part addresses various microCT applications, organized by type of microstructure so that the reader can appreciate approaches from other disciplines. The applications include porous solids, microstructural evolution, soft tissue studies, applications using x-ray phase contrast or x-ray scattering contrast, and multimode studies.

Dilute III-V Nitride Semiconductors and Material Systems

Dilute III-V Nitride Semiconductors and Material Systems
Author: Ayse Erol
Publisher: Springer
Total Pages: 592
Release: 2009-09-02
Genre: Technology & Engineering
ISBN: 9783540842996

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This book reviews the current status of research and development in dilute III-V nitrides. It covers major developments in this new class of materials within 24 chapters from prominent research groups. The book integrates materials science and applications in optics and electronics in a unique way. It is valuable both as a reference work for researchers and as a study text for graduate students.

In Situ Process Diagnostics and Modeling: Volume 569

In Situ Process Diagnostics and Modeling: Volume 569
Author: Orlando Auciello
Publisher:
Total Pages: 226
Release: 1999-08-11
Genre: Technology & Engineering
ISBN:

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Papers from an April 1999 symposium demonstrate the need for the development and application of a variety of complementary in situ, real-time characterization techniques to advance the science and technology of thin films and interfaces critical to the development of a new generation of thin-film-based devices. Papers are arranged in sections on in situ ion and electron-beam analysis, in situ spectroscopic ellipsometry and other optical characterization, in situ diagnostics and modeling, in situ emission and optical characterization techniques, and in situ X-ray, TEM, and STM/AFM characterization and processing control. Auciello is affiliated with Argonne National Laboratory. Annotation copyrighted by Book News, Inc., Portland, OR