Ion and Neutral Spectroscopy
Author | : David Briggs |
Publisher | : |
Total Pages | : 738 |
Release | : 1992 |
Genre | : |
ISBN | : 9783793555483 |
Download Ion and Neutral Spectroscopy Book in PDF, Epub and Kindle
Download Practical Surface Analysis Ion And Neutral Spectroscopy full books in PDF, epub, and Kindle. Read online free Practical Surface Analysis Ion And Neutral Spectroscopy ebook anywhere anytime directly on your device. Fast Download speed and no annoying ads. We cannot guarantee that every ebooks is available!
Author | : David Briggs |
Publisher | : |
Total Pages | : 738 |
Release | : 1992 |
Genre | : |
ISBN | : 9783793555483 |
Author | : D. Briggs |
Publisher | : Wiley |
Total Pages | : 756 |
Release | : 1992-11-17 |
Genre | : Science |
ISBN | : 9780471920823 |
Author | : David Briggs |
Publisher | : |
Total Pages | : |
Release | : 1992 |
Genre | : |
ISBN | : |
Author | : D. Briggs |
Publisher | : |
Total Pages | : 694 |
Release | : 1990-11-30 |
Genre | : Science |
ISBN | : |
The aim of this text is to present the background, the important concepts, and tabulated data of Auger electron spectroscopy (AES) and x-ray photoelectron spectroscopy (XPS) in a practical context for those involved in applied surface analysis techniques.
Author | : J. M. Walls |
Publisher | : CUP Archive |
Total Pages | : 356 |
Release | : 1990-04-12 |
Genre | : Science |
ISBN | : 9780521386906 |
Author | : A.W. Czanderna |
Publisher | : Elsevier |
Total Pages | : 496 |
Release | : 2012-12-02 |
Genre | : Science |
ISBN | : 0444596453 |
Methods of Surface Analysis deals with the determination of the composition of surfaces and the identification of species attached to the surface. The text applies methods of surface analysis to obtain a composition depth profile after various stages of ion etching or sputtering. The composition at the solid—solid interface is revealed by systematically removing atomic planes until the interface of interest is reached, in which the investigator can then determine its composition. The book reviews the effect of ion etching on the results obtained by any method of surface analysis including the effect of the rate of etching, incident energy of the bombarding ion, the properties of the solid, the effect of the ion etching on generating an output signal of electrons, ions, or neutrals. The text also describes the effect of the residual gases in the vacuum environment. The book considers the influence of the sample geometry, of the type (metal, insulator, semiconductor, organic), and of the atomic number can have on surface analysis. The text describes in detail low energy ion scattering spectroscopy, X-ray photoelectron spectroscopy, Auger electron spectroscopy, secondary ion mass spectroscopy, and infrared reflection-absorption spectroscopy. The book can prove useful for researchers, technicians, and scientists whose works involve organic chemistry, analytical chemistry, and other related fields of chemistry, such as physical chemistry or inorganic chemistry.
Author | : Alvin W. Czanderna |
Publisher | : Springer Science & Business Media |
Total Pages | : 479 |
Release | : 2012-12-06 |
Genre | : Science |
ISBN | : 1461537088 |
Determining the elemental composition of surfaces is an essential measurement in characterizing solid surfaces. At present, many ap proaches may be applied for measuring the elemental and molecular composition of a surface. Each method has particular strengths and limitations that often are directly connected to the physical processes involved. Typically, atoms and molecules on the surface and in the near surface region may be excited by photons, electrons, ions, or neutrals, and the detected particles are emitted, ejected, or scattered ions or electrons. The purpose of this book is to bring together a discussion of the surface compositional analysis that depends on detecting scattered or sputtered ions, and the methods emphasized are those where instruments are commercially available for carrying out the analysis. For each topic treated, the physical principles, instrumentation, qualitative analysis, artifacts, quantitative analysis, applications, opportunities, and limita tions are discussed. The first chapter provides an overview of the role of elemental composition in surface science; compositional depth profiling; stimulation by an electric field, electrons, neutrals, or photons and detection of ions; and then stimulation by ions, and detection of ions, electrons, photons, or neutrals.
Author | : Graham C. Smith |
Publisher | : Springer Science & Business Media |
Total Pages | : 165 |
Release | : 2013-11-21 |
Genre | : Science |
ISBN | : 1489909672 |
This book is t~e fifth in aseries of scientific textbooks designed to cover advances in selected research fields from a basic and general view point. The reader is taken carefully but rapidly through the introductory material in order that t~e significance of recent developments can be understood with only limited initial knowledge. The inclusion in the Appendix of the abstracts of many of the more important papers in the field provides further assistance for the non-specialist, and acts as aspringboard to supplementary reading for those who wish to consult the original liter ature. Surface analysis has been the subject of numerous books and review articles, and the fundamental scientific principles of t~e more popular techniques are now reasonably weIl established. This book is concerned with the very powerful techniques of Auger electron and X-ray photoelectron spectroscopy (AES and XPS), with an emphasis on how they may be performed as part of a modern analytical facility. Since the development of AES and XPS in the late 1960s and early 1970s there have been great strides forward in the sensitivities and resolutions of the instrumentation. Simultaneously, these spectroscopies have undergone a veritable explosion, both in their acceptance alongside more routine ana1ytical techniques and in the range of problems and materials to which they are applied. As a result, many researchers in industry and in academia now come into contact with AES and XPS not as specialists, but as users.
Author | : John C. Vickerman |
Publisher | : John Wiley & Sons |
Total Pages | : 690 |
Release | : 2011-08-10 |
Genre | : Technology & Engineering |
ISBN | : 1119965519 |
This completely updated and revised second edition of Surface Analysis: The Principal Techniques, deals with the characterisation and understanding of the outer layers of substrates, how they react, look and function which are all of interest to surface scientists. Within this comprehensive text, experts in each analysis area introduce the theory and practice of the principal techniques that have shown themselves to be effective in both basic research and in applied surface analysis. Examples of analysis are provided to facilitate the understanding of this topic and to show readers how they can overcome problems within this area of study.
Author | : David Briggs |
Publisher | : |
Total Pages | : 776 |
Release | : 1990 |
Genre | : Auger effect |
ISBN | : |