IEEE Standard Test Interface Language (STIL) for Digital Test Vector Data

IEEE Standard Test Interface Language (STIL) for Digital Test Vector Data
Author:
Publisher:
Total Pages: 132
Release: 1999
Genre: Integrated circuits
ISBN: 9780738116464

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Standard Test Interface Language (STIL) provides an interface between digital test generation tools and test equipment. A test description language is defined that: (a) facilitates the transfer of digital test vector data from CAE to ATE environments; (b) specifies pattern, format, and timing information sufficient to define the application of digital test vectors to a DUT; and (c) supports the volume of test vector data generated from structured tests.

IEEE Std 1450-1999

IEEE Std 1450-1999
Author:
Publisher:
Total Pages:
Release: 1999
Genre:
ISBN:

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Standard Test Interface Language (STIL) for Digital Test Vector Data

Standard Test Interface Language (STIL) for Digital Test Vector Data
Author: British Standards Institute Staff
Publisher:
Total Pages: 144
Release: 2007-12-31
Genre:
ISBN: 9780580593130

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Programming languages, Interfaces (data processing), Information exchange, Data transfer, Data processing, Automatic, Test equipment, Computer applications, Simulation, Data representation, Vectors (mathematics)