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| Total Pages | : 148 |
| Release | : 1999 |
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| Author | : National Institute of Standards and Technology (U.S.) |
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| Release | : 1999* |
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| Author | : National Semiconductor Metrology Program (U.S.) |
| Publisher | : |
| Total Pages | : 148 |
| Release | : 1999 |
| Genre | : Semiconductors |
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| Author | : National Institute of Standards and Technology (U.S.) |
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| Total Pages | : 148 |
| Release | : 1999 |
| Genre | : Semiconductors |
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| Author | : National Institute of Standards and Technology (U.S.) |
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| Total Pages | : 160 |
| Release | : 2000 |
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| Release | : 2000 |
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| Author | : National Semiconductor Metrology Program (U.S.) |
| Publisher | : |
| Total Pages | : 136 |
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| Genre | : Semiconductors |
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| Author | : National Institute of Standards and Technology (U.S.) |
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| Total Pages | : 252 |
| Release | : 1990 |
| Genre | : Semiconductors |
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| Author | : National Institute of Standards and Technology (U.S.) |
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| Total Pages | : 1162 |
| Release | : 1994 |
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