Spatially Resolved Characterization in Thin-Film Photovoltaics

Spatially Resolved Characterization in Thin-Film Photovoltaics
Author: Matevž Bokalič
Publisher: Springer
Total Pages: 0
Release: 2015-02-04
Genre: Technology & Engineering
ISBN: 9783319146508

Download Spatially Resolved Characterization in Thin-Film Photovoltaics Book in PDF, Epub and Kindle

The book is devoted to the spatial characterization of solar cells and PV modules. It is written both as a monograph as well as a succinct guide for the state-of-the-art spatial characterization techniques and approaches. Amongst the approaches discussed are visual imaging, electro- and photo-luminescence imaging, thermography, and light beam induced mapping techniques. Emphasis is given on the luminescence image acquisition and interpretation due to its great potential. Characterization techniques are accompanied by simulation tools. The contents are aimed at a readership of students and senior researchers in R&D as well as engineers in industry who are newcomers to the spatial characterization of either solar cells or PV modules. The concepts and approaches presented herein are based on but not limited to case studies of real thin-film PV devices. Key features:  Review of spatially resolved characterization techniques and accompanying SPICE simulations in photovoltaics  Use of spatially resolved characterization techniques and their combinations for the identification of inhomogeneities in small area CdTe and dye-sensitized solar cells  Case studies of electroluminescence imaging of commercial PV modules (c-Si, CIGS, CdTe, a-Si, tandem and triple junction thin-film-Si) The contents are aimed at a readership of students and senior researchers in R&D as well as engineers in industry who are newcomers to the spatial characterization of either solar cells or PV modules. The concepts and approaches presented herein are based on but not limited to case studies of real thin-film PV devices. Key features:  Review of spatially resolved characterization techniques and accompanying SPICE simulations in photovoltaics  Use of spatially resolved characterization techniques and their combinations for the identification of inhomogeneities in small area CdTe and dye-sensitized solar cells  Case studies of electroluminescence imaging of commercial PV modules (c-Si, CIGS, CdTe, a-Si, tandem and triple junction thin-film-Si)

Spatially Resolved Photocurrent Mapping of Operating Organic Photovoltaic Devices Using Atomic Force Photovoltaic Microscopy

Spatially Resolved Photocurrent Mapping of Operating Organic Photovoltaic Devices Using Atomic Force Photovoltaic Microscopy
Author:
Publisher:
Total Pages: 7
Release: 2008
Genre:
ISBN:

Download Spatially Resolved Photocurrent Mapping of Operating Organic Photovoltaic Devices Using Atomic Force Photovoltaic Microscopy Book in PDF, Epub and Kindle

A conductive atomic force microscopy (cAFM) technique, atomic force photovoltaic microscopy (AFPM), has been developed to characterize spatially localized inhomogeneities in organic photovoltaic (OPV) devices. In AFPM, a biased cAFM probe is raster scanned over an array of illuminated solar cells, simultaneously generating topographic and photocurrent maps. As proof of principle, AFPM is used to characterize OPVs, revealing substantial device to device and temporal variations in the short-circuit current. The flexibility of AFPM suggests applicability to nanoscale characterization of a wide range of optoelectronically active materials and devices.

An Assessment of the National Institute of Standards and Technology Center for Nanoscale Science and Technology

An Assessment of the National Institute of Standards and Technology Center for Nanoscale Science and Technology
Author: National Research Council
Publisher: National Academies Press
Total Pages: 30
Release: 2011-11-14
Genre: Technology & Engineering
ISBN: 0309220076

Download An Assessment of the National Institute of Standards and Technology Center for Nanoscale Science and Technology Book in PDF, Epub and Kindle

Since 1959, the National Research Council (NRC), at the request of the National Institute of Standards and Technology (NIST), has annually assembled panels of experts to assess the quality and effectiveness of the NIST measurements and standards laboratories. In 2011, the NRC evaluated three of the six NIST laboratories: the Center for Nanoscale Science and Technology (CNST), the NIST Center for Neutron Research (NCNR) and the Information Technology Laboratory (ITL). Each of these was addressed individually by a separate panel of experts; this report assesses CNST.

Mechanical Stress on the Nanoscale

Mechanical Stress on the Nanoscale
Author: Margrit Hanbücken
Publisher: John Wiley & Sons
Total Pages: 354
Release: 2011-12-07
Genre: Technology & Engineering
ISBN: 3527639551

Download Mechanical Stress on the Nanoscale Book in PDF, Epub and Kindle

Bringing together experts from the various disciplines involved, this first comprehensive overview of the current level of stress engineering on the nanoscale is unique in combining the theoretical fundamentals with simulation methods, model systems and characterization techniques. Essential reading for researchers in microelectronics, optoelectronics, sensing, and photonics.

Surface and Interface Characterization of Thin Film Energy Devices

Surface and Interface Characterization of Thin Film Energy Devices
Author: Wŏn-yong Yi
Publisher: Stanford University
Total Pages: 241
Release: 2010
Genre:
ISBN:

Download Surface and Interface Characterization of Thin Film Energy Devices Book in PDF, Epub and Kindle

Thin film devices for energy conversion have become a vital area of research to achieve high performance with low cost. As the surface-to-volume ratio becomes significant, the fundamental physics of the surface and interface microstructures and the reaction mechanisms are important to developing such energy devices or processes. My Ph.D. research is thus focus on surface and interface characterization of energy materials for thin film devices with engineered components fabricated by novel technologies. The first part of this dissertation discusses how surface microstructures influence fuel cell performance. According to the high resolution characterization of surface grain boundaries in solid oxide ion conductors, oxygen vacancy segregation at grain boundaries was observed, indicating that the grain boundaries can be more active sites for oxygen incorporation into the electrolyte. This preferred surface reaction at grain boundaries was verified by AC impedance spectroscopy. In addition, using atomic force microscopy, the local rearrangement of charged species on the oxide surface was investigated as a function of time and temperature to quantitatively analyze the diffusivity of oxygen vacancies on the surface. The second part discusses investigation of quantum confined structures that was aimed at contributing to the development of new solar cell architectures. The electronic properties of quantum confined structures, fabricated by atomic layer deposition (ALD), were characterized by scanning tunneling microscopy. In particular, the band gap of lead sulfide quantum well was tuned as a function of well thickness and potential barrier height. In addition, various nano-patterning techniques were developed to fabricate higher-order quantum confined structures, including area-selective ALD.

Commerce, Justice, Science, and Related Agencies Appropriations for 2011

Commerce, Justice, Science, and Related Agencies Appropriations for 2011
Author: United States. Congress. House. Committee on Appropriations. Subcommittee on Commerce, Justice, Science, and Related Agencies
Publisher:
Total Pages: 2044
Release: 2010
Genre: Administrative agencies
ISBN:

Download Commerce, Justice, Science, and Related Agencies Appropriations for 2011 Book in PDF, Epub and Kindle

Spatially Resolved Characterization of Local Phenomena in Materials and Nanostructures: Volume 738

Spatially Resolved Characterization of Local Phenomena in Materials and Nanostructures: Volume 738
Author: Javier Piqueras
Publisher:
Total Pages: 456
Release: 2003-03-27
Genre: Science
ISBN:

Download Spatially Resolved Characterization of Local Phenomena in Materials and Nanostructures: Volume 738 Book in PDF, Epub and Kindle

A primary driver of progress in nanoscience and technology is the continuing advances in the ability to measure structure, and particularly properties, at spatially localized scales. From the point of view of characterization, it is worth mentioning advances in the interpretation of processes in semiconductors, the ability to observe and manipulate metal, carbon and silicon nanowires and nanodots, and studies in molecular self-assembly. The papers in this book fall into two categories - those addressing classes of characterization techniques that emphasize how the combination of theoretical, experimental, and instrumentational developments lead to new capabilities in nanoscale characterization, and those focused on the use of various spatially localized approaches on a single phenomenon or materials issue. Topics include: characterization with electron optics; novel measurements of nanoscale properties; size-dependent behavior of nanoparticles; biological systems at the nanoscale; processing and properties of nanowires and heterostructures; and local phenomena in materials and microstructures.