Introduction to Electron Optics
| Author | : Vernon Ellis Cosslett |
| Publisher | : |
| Total Pages | : 332 |
| Release | : 1950 |
| Genre | : Science |
| ISBN | : |
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Introduction To Electron Optics
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Introduction to Electron Optics
| Author | : V. E. Cosslett |
| Publisher | : |
| Total Pages | : |
| Release | : 1946 |
| Genre | : |
| ISBN | : |
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Electron and Ion Optics
| Author | : Miklos Szilagyi |
| Publisher | : Springer Science & Business Media |
| Total Pages | : 550 |
| Release | : 2012-12-06 |
| Genre | : Technology & Engineering |
| ISBN | : 1461309239 |
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The field of electron and ion optics is based on the analogy between geometrical light optics and the motion of charged particles in electromagnetic fields. The spectacular development of the electron microscope clearly shows the possibilities of image formation by charged particles of wavelength much shorter than that of visible light. As new applications such as particle accelerators, cathode ray tubes, mass and energy spectrometers, microwave tubes, scanning-type analytical instruments, heavy beam technologies, etc. emerged, the scope of particle beam optics has been exten ded to the formation of fine probes. The goal is to concentrate as many particles as possible in as small a volume as possible. Fabrication of microcircuits is a good example of the growing importance of this field. The current trend is towards increased circuit complexity and pattern density. Because of the diffraction limitation of processes using optical photons and the technological difficulties connected with x-ray processes, charged particle beams are becoming popular. With them it is possible to write directly on a wafer under computer control, without using a mask. Focused ion beams offer especially great possibilities in the submicron region. Therefore, electron and ion beam technologies will most probably playa very important role in the next twenty years or so.
Principles of Electron Optics
| Author | : Peter W. Hawkes |
| Publisher | : Academic Press |
| Total Pages | : 755 |
| Release | : 2012-12-02 |
| Genre | : Science |
| ISBN | : 0080984169 |
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The three volumes in the PRINCIPLES OF ELECTRON OPTICS Series constitute the first comprehensive treatment of electron optics in over forty years. While Volumes 1 and 2 are devoted to geometrical optics, Volume 3 is concerned with wave optics and effects due to wave length. Subjects covered include: Derivation of the laws of electron propagation from SchrUdinger's equation Image formation and the notion of resolution The interaction between specimens and electrons Image processing Electron holography and interference Coherence, brightness, and the spectral function Together, these works comprise a unique and informative treatment of the subject. Volume 3, like its predecessors, will provide readers with both a textbook and an invaluable reference source.
Introduction to Electron and Ion Optics
| Author | : Poul Dahl |
| Publisher | : Elsevier |
| Total Pages | : 156 |
| Release | : 2012-12-02 |
| Genre | : Science |
| ISBN | : 0323160905 |
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Introduction to Electron and Ion Optics provides the theoretical background needed to understand the subject matter and even be helpful in laboratory works. Seven major parts comprise the book where each focuses on a certain aspect or field. The book begins with an introduction to the general principles about electron and ion optics, specifically as basis for the design of the optical components used in particle analyzers and accelerators. The following parts tackle different aspects such as geometrical optics; scaling rules and dispersion coefficients; fields (paraxial, sector, fringing, quadrupole); lenses (electrostatic, immersion, unipotential, etc.); analyzers (electrostatic, spherical, etc.); and space charge and beam production. Towards the last part of the book, there is an exercises section where various problems are given for the reader to answer. This book caters to students specifically in the field of physics.
Introduction to Electron Optics
| Author | : V. E. Cosslett |
| Publisher | : |
| Total Pages | : 293 |
| Release | : 1986 |
| Genre | : |
| ISBN | : |
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Physical Principles of Electron Microscopy
| Author | : Ray Egerton |
| Publisher | : Springer Science & Business Media |
| Total Pages | : 224 |
| Release | : 2011-02-11 |
| Genre | : Technology & Engineering |
| ISBN | : 9780387258003 |
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Scanning and stationary-beam electron microscopes are indispensable tools for both research and routine evaluation in materials science, the semiconductor industry, nanotechnology and the biological, forensic, and medical sciences. This book introduces current theory and practice of electron microscopy, primarily for undergraduates who need to understand how the principles of physics apply in an area of technology that has contributed greatly to our understanding of life processes and "inner space." Physical Principles of Electron Microscopy will appeal to technologists who use electron microscopes and to graduate students, university teachers and researchers who need a concise reference on the basic principles of microscopy.
An Introduction to Electron Optics
| Author | : Louis Jacob |
| Publisher | : |
| Total Pages | : 176 |
| Release | : 1951 |
| Genre | : Electron optics |
| ISBN | : |
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Introduction to Electron Microscopy
| Author | : Saul Wischnitzer |
| Publisher | : |
| Total Pages | : 152 |
| Release | : 1962 |
| Genre | : Electron microscopes |
| ISBN | : |
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Basic theory of electron microscopy; Nature of light beams; Resolution; Diffraction; Limit of resolution; Nature of electron beams; Electron emission; Electron optics; Introduction; Magnetic fields; Action of magnetic fields as lenses; Magnetic focusing; Evolution of magnetic lenses for electron microscopy; Analogy between light and electron microscopes; The electron microscope; Illuminating system; Electron gun; Filament; Shield; Anode; Non-biased and biased guns; Self-biased gun; Operation of self-biased gun; Condenser lens; Aperture angle; Intensity; Depth of field; Condenser lens operation; Imaging system; Objective lens; Pole pieces; Lens aberration spherical and chromatic; Limitation of objective lens aberration; Contrast and image formation; Objective lens operation; Projecton lens; magnification and final image formation; Range of magnification; Image translating system; Fluorescent observation screen; Photographic recording; Summary of general considerations in image translation; Beam intensity level; Choice of photographic emulsion; Other electron microscope components; Specimen chamber and holder; Photographic chamber; Vacuum supply; Filament current supply; High voltage supply; Operational requirements; Alignment; Electron gun-condenser alignment; Lens alignment; Detection of lens asymmetry; Disturbances; Magnetic fields; Mechanical; Specimen instability; Contamination; Vacuum leaks; Operation of the electron microscope; Manipulation; Photography; Determination of magnification; Test of resolution; Differences between light and electron microscope.
Introduction to Modern Optics
| Author | : Grant R. Fowles |
| Publisher | : Courier Corporation |
| Total Pages | : 356 |
| Release | : 2012-04-25 |
| Genre | : Science |
| ISBN | : 048613492X |
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A complete basic undergraduate course in modern optics for students in physics, technology, and engineering. The first half deals with classical physical optics; the second, quantum nature of light. Solutions.
