High Resolution X-Ray Diffractometry And Topography

High Resolution X-Ray Diffractometry And Topography
Author: D.K. Bowen
Publisher: CRC Press
Total Pages: 263
Release: 1998-02-05
Genre: Technology & Engineering
ISBN: 0203979192
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The rapid growth in the applications of electronic materials has created an increasing demand for reliable techniques for examining and characterizing these materials. This book explores the area of x-ray diffraction and the techniques available for deployment in research, development, and production. It maps the theoretical and practical background necessary to study single crystal materials using high resolution x-ray diffraction and topography. It combines mathematical formalism with graphical explanations and hands-on advice for interpreting data, thus providing the theoretical and practical background for applying these techniques in scientific and industrial materials characterization

X-Ray Diffraction Topography

X-Ray Diffraction Topography
Author: B. K. Tanner
Publisher: Elsevier
Total Pages: 189
Release: 2013-10-22
Genre: Science
ISBN: 1483187683
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X-Ray Diffraction Topography presents an elementary treatment of X-ray topography which is comprehensible to the non-specialist. It discusses the development of the principles and application of the subject matter. X-ray topography is the study of crystals which use x-ray diffraction. Some of the topics covered in the book are the basic dynamical x-ray diffraction theory, the Berg-Barrett method, Lang’s method, double crystal methods, the contrast on x-ray topography, and the analysis of crystal defects and distortions. The crystals grown from solution are covered. The naturally occurring crystals are discussed. The text defines the meaning of melt, solid state and vapour growth. An analysis of the properties of inorganic crystals is presented. A chapter of the volume is devoted to the characteristics of metals. Another section of the book focuses on the production of ice crystals and the utilization of oxides as laser materials. The book will provide useful information to chemists, scientists, students and researchers.

European Symposium on X-Ray Topography and High Resolution Diffraction (2nd) Held in Berlin, Germany on 5-7 September 1994. Programme and Abstracts

European Symposium on X-Ray Topography and High Resolution Diffraction (2nd) Held in Berlin, Germany on 5-7 September 1994. Programme and Abstracts
Author:
Publisher:
Total Pages: 226
Release: 1994
Genre:
ISBN:
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Partial Contents: Early experimental proofs of the dynamical theory; Topography in magnetism: domain and phase transition investigations; Diffraction topographic investigations of crystals under applied electric fields; Dependence of defect arrangement in crystals on surface morphology and on conditions of growth from solution; Interaction of slip bands with grain boundaries - observation by white beam SR topography; In-situ X-ray topography studies during the MBE growth process of InGaAs strained layers; Double- and triple-crystal X- ray diffraction analysis of semiconductor quantum wires; Applications in multiple crystal diffractometry; Interpretation of the diffraction profile resulting from strain relaxation in epilayers; Study of thin buried interfaces in III-V compound hetero-structures by high resolution X-ray diffraction.

X-Ray and Neutron Dynamical Diffraction

X-Ray and Neutron Dynamical Diffraction
Author: André Authier
Publisher: Springer Science & Business Media
Total Pages: 419
Release: 2012-12-06
Genre: Science
ISBN: 1461558794
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This volume collects the proceedings of the 23rd International Course of Crystallography, entitled "X-ray and Neutron Dynamical Diffraction, Theory and Applications," which took place in the fascinating setting of Erice in Sicily, Italy. It was run as a NATO Advanced Studies Institute with A. Authier (France) and S. Lagomarsino (Italy) as codirectors, and L. Riva di Sanseverino and P. Spadon (Italy) as local organizers, R. Colella (USA) and B. K. Tanner (UK) being the two other members of the organizing committee. It was attended by about one hundred participants from twenty four different countries. Two basic theories may be used to describe the diffraction of radiation by crystalline matter. The first one, the so-called geometrical, or kinematical theory, is approximate and is applicable to small, highly imperfect crystals. It is used for the determination of crystal structures and describes the diffraction of powders and polycrystalline materials. The other one, the so-called dynamical theory, is applicable to perfect or nearly perfect crystals. For that reason, dynamical diffraction of X-rays and neutrons constitutes the theoretical basis of a great variety of applications such as: • the techniques used for the characterization of nearly perfect high technology materials, semiconductors, piezoelectric, electrooptic, ferroelectric, magnetic crystals, • the X-ray optical devices used in all modem applications of Synchrotron Radiation (EXAFS, High Resolution X-ray Diffractometry, magnetic and nuclear resonant scattering, topography, etc. ), and • X-ray and neutron interferometry.