Generation of Standard Electromagnetic Fields in a Tem Cell (Classic Reprint)

Generation of Standard Electromagnetic Fields in a Tem Cell (Classic Reprint)
Author: Motohisa Kanda
Publisher: Forgotten Books
Total Pages: 256
Release: 2018-09-22
Genre: Technology & Engineering
ISBN: 9781396340703

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Excerpt from Generation of Standard Electromagnetic Fields in a Tem Cell Key words zantenna antenna calibration; calibration; electro magnetic field; radio frequency; standard field;'tem cell; transverse electromagnetic cell. About the Publisher Forgotten Books publishes hundreds of thousands of rare and classic books. Find more at www.forgottenbooks.com This book is a reproduction of an important historical work. Forgotten Books uses state-of-the-art technology to digitally reconstruct the work, preserving the original format whilst repairing imperfections present in the aged copy. In rare cases, an imperfection in the original, such as a blemish or missing page, may be replicated in our edition. We do, however, repair the vast majority of imperfections successfully; any imperfections that remain are intentionally left to preserve the state of such historical works.

Design Construction and Evaluation of a TEM Transmission Cell for Field Probe Calibration

Design Construction and Evaluation of a TEM Transmission Cell for Field Probe Calibration
Author: Stavros Ioannis Mpoukis
Publisher:
Total Pages: 118
Release: 1979
Genre:
ISBN:

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This paper discusses the design, construction and evaluation of a transverse electromagnetic (TEM) transmission cell for accurate generation of broad-band susceptibility test fields within a shielded environment. A 0.3x0.5x1.0 m TEM cell, constructed at the Naval Postgraduate School (NPGS), was designed to operate as a 50-ohm impedance-matched system and was used for calibrating electromagnetic field probes. According to the basic design, uniform and standard TEM fields can be generated inside the cell for frequencies lower than the cutoff frequency of the device. The high frequency multimode effects can be suppressed by loading the cell with radio frequency (RF) absorbing material thus increasing the useful bandwidth. Measurements of characteristic impedance distributed along the cell, voltage standing wave ratio (VSWR) and tests of field uniformity from 1-1000 MHz were taken and described for both empty and absorber loaded cells. The method and the results of calibrating two types of probes are also discussed. (Author).

Immunity to Radiated Electromagnetic Fields; 10 Khz to 200 Mhz--Crawford Tem Cell and 10 Khz to 5 Ghz--Wideband Tem Cell

Immunity to Radiated Electromagnetic Fields; 10 Khz to 200 Mhz--Crawford Tem Cell and 10 Khz to 5 Ghz--Wideband Tem Cell
Author: Electromagnetic Compatibility (EMC) Standards
Publisher:
Total Pages: 0
Release: 2000
Genre:
ISBN:

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This part of SAE J1113 specifies TEM cell test methods and procedures for testing the electromagnetic immunity of electronic components (DUTs) for passenger cars, commercial vehicles and similar applications. Methods using the constant cross-section TEM cell (Crawford TEM) and the flared cross-section TEM cell (wideband TEM) are discussed in the document. The electromagnetic disturbance considered in this part of SAE J1113 will be limited to continuous narrowband electromagnetic fields. TEM cells produce both electric and magnetic fields simultaneously. The test is directly applicable to DUTs whose height is less than 1/3 the septum height; somewhat larger modules can be tested with conditions applied. The Crawford TEM and wideband TEM cell may be used for testing within the 1/3 height condition without demonstrating field uniformity within the cell, if the test set-up complies with the other provisions of this standard. This test can be used for two purposes: a. Testing the immunity of DUTs with major field coupling to the DUT and wiring harness;b. Testing the immunity of DUTs with major field coupling to the DUT. The methods defined in this document have some significant differences from ISO 11452-3. Careful deliberation has been given to the need to diverge from the international standard. The primary differences are the method of bringing leads from the DUT out of the TEM cell and the inclusion of the wideband TEM cell. Immunity measurements of complete vehicles are generally only possible by the vehicle manufacturer. The reasons, for example, are the high costs of a vehicle sized absorber lined chamber, preserving the secrecy of prototypes or the large number of different vehicle models. Therefore, for research, development and quality control a laboratory measuring method shall be applied by the component manufacturer.

Electromagnetic Compatibility Measurement Procedure for Vehicle Components-Immunity to Radiated Electromagnetic Fields, 10 Khz to 1000 Mhz-Tri-Plate Line Method

Electromagnetic Compatibility Measurement Procedure for Vehicle Components-Immunity to Radiated Electromagnetic Fields, 10 Khz to 1000 Mhz-Tri-Plate Line Method
Author: Electromagnetic Compatibility (EMC) Standards
Publisher:
Total Pages: 0
Release: 1999
Genre:
ISBN:

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This procedure covers the recommended testing techniques for thedetermination of radiated immunity of an automotive electronicdevice. This technique uses a Tri-Plate Line (TPL) operating over afrequency range from 10 KHz to 1000 MHz. This technique is limitedto components which have a maximum height of equal to or less than1/3 the height between the driven element and the outer, groundplates.A TPL, a variation of a TEM cell design, is constructed withoutsides to the cell. The primary advantage to the use of the TPL asopposed to a TEM cell is that its construction permits largedevices to be placed within the cell with their associated cablesattached without special feed through ports or adapters as requiredfor a TEM cell. The lack of sides which would be found in a TEMcell permits easy routing of the cables to and from the EquipmentUnder Test (DUT).The TPL does not have a serious problem with fields reflectedfrom the side walls as does with the TEM cell. This permits its useto frequencies above that of a TEM cell of the same physical size.Note that although the construction of the TPL limits generation ofuniform electric and magnetic fields to frequencies below 500 MHz,experience has shown that the TPL may be used at frequencies up to1 GHz and still provide reasonable and repeatable test results.This may only occur if the test setup requirements (i.e., DUT plus1 meter of cable) and characterization procedures, delineated inthis SAE Standard permits its use to frequencies above that of aTEM cell of the same physical size. Note that although theconstruction of the TPL limits generation of uniform electric andmagnetic fields to frequencies below 500 MHz, experience has shownthat the TPL may be used at frequencies up to 1 GHz and stillprovide reasonable and repeatable test results. This may only occurif the test setup requirements (i.e., DUT plus 1 meter of cable)and characterization procedures, delineated in this SAE Standardare followed.The lack of side walls also means that the TPL must be usedwithin an RF shielded enclosure to prevent RF energy, radiated fromthe TPL from interfering with near-by electronic devices. Toprevent potential resonances and reflected waves within theshielded enclosure from distorting the fields produced within theTPL, the test chamber walls and ceiling must be lined with RFabsorbing material. These issues are discussed in greater detail inthe body of this are followed.The lack of side walls also means that the TPL must be usedwithin an RF shielded enclosure to prevent RF energy, radiated fromthe TPL from interfering with near-by electronic devices. Toprevent potential resonances and reflected waves within theshielded enclosure from distorting the fields produced within theTPL, the test chamber walls and ceiling must be lined with RFabsorbing material. These issues are discussed in greater detail inthe body of this document.CAUTION--Hazardous voltages and fields exist on and near the TPLwhen the equipment is energized. Test personnel should ensure thatno one is in the test chamber during a test. It is the intent ofthe EMI committee to withdraw this document in five years unlessthere is a demand to retain the document.