Infrared Spectroscopic Investigations on II-VI Semi-Magnetic Semiconductors

Infrared Spectroscopic Investigations on II-VI Semi-Magnetic Semiconductors
Author:
Publisher: Cuvillier Verlag
Total Pages: 164
Release: 2006-02-01
Genre: Science
ISBN: 3736917961

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In this dissertation, we investigated ZnSe-based materials, which are interesting for a variety of potential applications in various devices. There was only limited information available in the literature about Zn1-xMnxSe material parameters like the electron effective mass and transport properties. In this work, we explored many new details about this interesting material using Fourier transform infrared spectroscopy and some other experimental techniques. The fundamental aspects related to lattice vibrations in mixed crystal alloys and reststrahlen band were also studied. In summary the following results have been obtained in this thesis: (A) Results from the series of chlorine-doped Zn1-xMnxSe samples: To extract information about the electron effective mass we performed roomtemperature plasma edge measurements on chlorine-doped n-type Zn1-xMnxSe epilayers. Via Drude-Lorentz-type multi-oscillator fits to our data, we extracted the optical electron effective mass (m*) in chlorine doped Zn1-xMnxSe:Cl samples for different Mn contents and free-electron concentrations. The free-electron concentration was determined using room-temperature van-der-Pauw Hall effect measurements. Our results indicate that: (A1) The electron effective mass in Zn1-xMnxSe is lower than that for ZnSe. A distinct reduction of the electron effective mass is observed upon Mn incorporation.

Spectroscopic Ellipsometry

Spectroscopic Ellipsometry
Author: Hiroyuki Fujiwara
Publisher: John Wiley & Sons
Total Pages: 388
Release: 2007-09-27
Genre: Technology & Engineering
ISBN: 9780470060186

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Ellipsometry is a powerful tool used for the characterization of thin films and multi-layer semiconductor structures. This book deals with fundamental principles and applications of spectroscopic ellipsometry (SE). Beginning with an overview of SE technologies the text moves on to focus on the data analysis of results obtained from SE, Fundamental data analyses, principles and physical backgrounds and the various materials used in different fields from LSI industry to biotechnology are described. The final chapter describes the latest developments of real-time monitoring and process control which have attracted significant attention in various scientific and industrial fields.

Optical Characterization of Semiconductors

Optical Characterization of Semiconductors
Author: Sidney Perkowitz
Publisher: Elsevier
Total Pages: 229
Release: 2012-12-02
Genre: Technology & Engineering
ISBN: 0080984274

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This is the first book to explain, illustrate, and compare the most widely used methods in optics: photoluminescence, infrared spectroscopy, and Raman scattering. Written with non-experts in mind, the book develops the background needed to understand the why and how of each technique, but does not require special knowledge of semiconductors or optics. Each method is illustrated with numerous case studies. Practical information drawn from the authors experience is given to help establish optical facilities, including commercial sources for equipment, and experimental details. For industrial scientists with specific problems in semiconducting materials; for academic scientists who wish to apply their spectroscopic methods to characterization problems; and for students in solid state physics, materials science and engineering, and semiconductor electronics and photonics, this book provides a unique overview, bringing together these valuable techniques in a coherent wayfor the first time. Discusses and compares infrared, Raman, and photoluminescence methods Enables readers to choose the best method for a given problem Illustrates applications to help non-experts and industrial users, with answers to selected common problems Presents fundamentals with examples from the semiconductor literature without excessive abstract discussion Features equipment lists and discussion of techniques to help establish characterization laboratories

Ellipsometry at the Nanoscale

Ellipsometry at the Nanoscale
Author: Maria Losurdo
Publisher: Springer Science & Business Media
Total Pages: 740
Release: 2013-03-12
Genre: Technology & Engineering
ISBN: 3642339565

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This book presents and introduces ellipsometry in nanoscience and nanotechnology making a bridge between the classical and nanoscale optical behaviour of materials. It delineates the role of the non-destructive and non-invasive optical diagnostics of ellipsometry in improving science and technology of nanomaterials and related processes by illustrating its exploitation, ranging from fundamental studies of the physics and chemistry of nanostructures to the ultimate goal of turnkey manufacturing control. This book is written for a broad readership: materials scientists, researchers, engineers, as well as students and nanotechnology operators who want to deepen their knowledge about both basics and applications of ellipsometry to nanoscale phenomena. It starts as a general introduction for people curious to enter the fields of ellipsometry and polarimetry applied to nanomaterials and progresses to articles by experts on specific fields that span from plasmonics, optics, to semiconductors and flexible electronics. The core belief reflected in this book is that ellipsometry applied at the nanoscale offers new ways of addressing many current needs. The book also explores forward-looking potential applications.

Semiconductor Optoelectronic Devices

Semiconductor Optoelectronic Devices
Author: Joachim Piprek
Publisher: Elsevier
Total Pages: 296
Release: 2013-10-22
Genre: Technology & Engineering
ISBN: 0080469787

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Optoelectronics has become an important part of our lives. Wherever light is used to transmit information, tiny semiconductor devices are needed to transfer electrical current into optical signals and vice versa. Examples include light emitting diodes in radios and other appliances, photodetectors in elevator doors and digital cameras, and laser diodes that transmit phone calls through glass fibers. Such optoelectronic devices take advantage of sophisticated interactions between electrons and light. Nanometer scale semiconductor structures are often at the heart of modern optoelectronic devices. Their shrinking size and increasing complexity make computer simulation an important tool to design better devices that meet ever rising perfomance requirements. The current need to apply advanced design software in optoelectronics follows the trend observed in the 1980's with simulation software for silicon devices. Today, software for technology computer-aided design (TCAD) and electronic design automation (EDA) represents a fundamental part of the silicon industry. In optoelectronics, advanced commercial device software has emerged recently and it is expected to play an increasingly important role in the near future. This book will enable students, device engineers, and researchers to more effectively use advanced design software in optoelectronics. Provides fundamental knowledge in semiconductor physics and in electromagnetics, while helping to understand and use advanced device simulation software Demonstrates the combination of measurements and simulations in order to obtain realistic results and provides data on all required material parameters Gives deep insight into the physics of state-of-the-art devices and helps to design and analyze of modern optoelectronic devices

Physical Properties of III-V Semiconductor Compounds

Physical Properties of III-V Semiconductor Compounds
Author: Sadao Adachi
Publisher: John Wiley & Sons
Total Pages: 342
Release: 1992-11-10
Genre: Science
ISBN: 9780471573296

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The objective of this book is two-fold: to examine key properties of III-V compounds and to present diverse material parameters and constants of these semiconductors for a variety of basic research and device applications. Emphasis is placed on material properties not only of Inp but also of InAs, GaAs and GaP binaries.

Ellipsometry of Functional Organic Surfaces and Films

Ellipsometry of Functional Organic Surfaces and Films
Author: Karsten Hinrichs
Publisher: Springer Science & Business Media
Total Pages: 369
Release: 2013-10-24
Genre: Science
ISBN: 3642401287

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Ellipsometry is the method of choice to determine the properties of surfaces and thin films. It provides comprehensive and sensitive characterization in contactless and non-invasive measurements. This book gives a state-of-the-art survey of ellipsometric investigations of organic films and surfaces, from laboratory to synchrotron applications, with a special focus on in-situ use in processing environments and at solid-liquid interfaces. In conjunction with the development of functional organic, meta- and hybrid materials for new optical, electronic, sensing and biotechnological devices and fabrication advances, the ellipsometric analysis of their optical and material properties has progressed rapidly in the recent years.