Characterization of the Microstructure of Fine Energetic Materials
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Total Pages | : 21 |
Release | : 2003 |
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ISBN | : |
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This report results from a contract tasking Fraunhofer Institut fur Chemische Technologie as follows: Lattice defects in energetic materials will be measured using X-ray diffraction. The method shall be tested for its ability to characterize lattice defects in RDX and HMX, where dislocations gliding and deformation twinning are believed to dominate mechanical behavior. X-ray diffraction patterns will be evaluated relating to phase, residual strain, crystallite size and micro strain. The occurring phases and the lattice parameters of the samples will be determined by Rietveld-method using literature data. Micro strain and crystallite size will be determined with the Williamson Hall method by plotting reciprocal peak widths versus reciprocal lattice distances. New routines for size/strain evaluation, implemented in Rietveld programs will be tested and compared with the Williamson Hall method.