Ultraviolet Detectors and Focal Plane Array Imagers Based on AlxGa1-xN P-I-N Photodiodes

Ultraviolet Detectors and Focal Plane Array Imagers Based on AlxGa1-xN P-I-N Photodiodes
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Total Pages:
Release: 2003
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This research has been conducted in order to address the absence of effective solid-state ultraviolet (UV) detectors and imagers. Despite the wide range of advances in visible and infrared imagery, until recently there have been no semiconductor devices under development for imaging strictly in the ultraviolet region of the spectrum. Much of the difficulty in creating such devices has been due to the lack of appropriate materials; however, the development of the group III-nitrides (III-N), including materials such as GaN and AlGaN, has provided a solution to this dilemma. The AlxGa1-xN based devices synthesized during this research were grown via organo-metallic vapor phase epitaxy and processed using standard photolithography, e-beam evaporation, and reactive ion etching processes. Focal plane arrays were subsequently bump bonded to silicon read-out integrated circuits (ROICs), which were then wire bonded to 84-pin leadless chip carriers. A specialized video camera and focal plane array evaluation software were used to test the imagers. The devices exhibit very low noise and very high sensitivity to ultraviolet radiation. Excellent quality UV images have been obtained for both 128x128 and 320x256 large format hybridized focal plane arrays. These new devices may find widespread usage in a number of applications that require sensitive UV detectors and UV imagers but where the cost, size, and power requirements of a photomultiplier tube cannot be justified.

Observing Photons in Space

Observing Photons in Space
Author: Martin C. E. Huber
Publisher: Springer Science & Business Media
Total Pages: 726
Release: 2013-12-11
Genre: Science
ISBN: 1461478049

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An ideal resource for lecturers, this book provides a comprehensive review of experimental space astronomy. The number of astronomers whose knowledge and interest is concentrated on interpreting observations has grown substantially in the past decades; yet, the number of scientists who are familiar with and capable of dealing with instrumentation has dwindled. All of the authors of this work are leading and experienced experts and practitioners who have designed, built, tested, calibrated, launched and operated advanced observing equipment for space astronomy. This book also contains concise information on the history of the field, supported by appropriate references. Moreover, scientists working in other fields will be able to get a quick overview of the salient issues of observing photons in any one of the various energy, wavelength and frequency ranges accessible in space. This book was written with the intention to make it accessible to advanced undergraduate and graduate students.

Optoelectronic Sensors

Optoelectronic Sensors
Author: Didier Decoster
Publisher: John Wiley & Sons
Total Pages: 246
Release: 2013-03-01
Genre: Technology & Engineering
ISBN: 1118622928

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Optoelectronic sensors combine optical and electronic systems for numerous applications including pressure sensors, security systems, atmospheric particle measurement, close tolerance measurement, quality control, and more. This title provides an examination of the latest research in photonics and electronics in the areas of sensors.

Semiconductor Laser Engineering, Reliability and Diagnostics

Semiconductor Laser Engineering, Reliability and Diagnostics
Author: Peter W. Epperlein
Publisher: John Wiley & Sons
Total Pages: 522
Release: 2013-01-25
Genre: Technology & Engineering
ISBN: 1118481860

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This reference book provides a fully integrated novel approach to the development of high-power, single-transverse mode, edge-emitting diode lasers by addressing the complementary topics of device engineering, reliability engineering and device diagnostics in the same book, and thus closes the gap in the current book literature. Diode laser fundamentals are discussed, followed by an elaborate discussion of problem-oriented design guidelines and techniques, and by a systematic treatment of the origins of laser degradation and a thorough exploration of the engineering means to enhance the optical strength of the laser. Stability criteria of critical laser characteristics and key laser robustness factors are discussed along with clear design considerations in the context of reliability engineering approaches and models, and typical programs for reliability tests and laser product qualifications. Novel, advanced diagnostic methods are reviewed to discuss, for the first time in detail in book literature, performance- and reliability-impacting factors such as temperature, stress and material instabilities. Further key features include: practical design guidelines that consider also reliability related effects, key laser robustness factors, basic laser fabrication and packaging issues; detailed discussion of diagnostic investigations of diode lasers, the fundamentals of the applied approaches and techniques, many of them pioneered by the author to be fit-for-purpose and novel in the application; systematic insight into laser degradation modes such as catastrophic optical damage, and a wide range of technologies to increase the optical strength of diode lasers; coverage of basic concepts and techniques of laser reliability engineering with details on a standard commercial high power laser reliability test program. Semiconductor Laser Engineering, Reliability and Diagnostics reflects the extensive expertise of the author in the diode laser field both as a top scientific researcher as well as a key developer of high-power highly reliable devices. With invaluable practical advice, this new reference book is suited to practising researchers in diode laser technologies, and to postgraduate engineering students.

Optical Metrology

Optical Metrology
Author: Kjell J. Gåsvik
Publisher: John Wiley & Sons
Total Pages: 372
Release: 2003-04-11
Genre: Technology & Engineering
ISBN: 0470846704

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New material on computerized optical processes, computerized ray tracing, and the fast Fourier transform, Bibre-Bragg sensors, and temporal phase unwrapping. * New introductory sections to all chapters. * Detailed discussion on lasers and laser principles, including an introduction to radiometry and photometry. * Thorough coverage of the CCD camera.

Frequency Standards

Frequency Standards
Author: Fritz Riehle
Publisher: John Wiley & Sons
Total Pages: 540
Release: 2006-03-06
Genre: Science
ISBN: 3527605959

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Of all measurement units, frequency is the one that may be determined with the highest degree of accuracy. It equally allows precise measurements of other physical and technical quantities, whenever they can be measured in terms of frequency. This volume covers the central methods and techniques relevant for frequency standards developed in physics, electronics, quantum electronics, and statistics. After a review of the basic principles, the book looks at the realisation of commonly used components. It then continues with the description and characterisation of important frequency standards from atomic clocks, to frequency stabilised lasers. The whole is rounded of with a discussion of topical applications in engineering, telecommunications, and metrology.

III-Nitride Ultraviolet Emitters

III-Nitride Ultraviolet Emitters
Author: Michael Kneissl
Publisher: Springer
Total Pages: 454
Release: 2015-11-12
Genre: Technology & Engineering
ISBN: 3319241001

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This book provides a comprehensive overview of the state-of-the-art in group III-nitride based ultraviolet LED and laser technologies, covering different substrate approaches, a review of optical, electronic and structural properties of InAlGaN materials as well as various optoelectronic components. In addition, the book gives an overview of a number of key application areas for UV emitters and detectors, including water purification, phototherapy, sensing, and UV curing. The book is written for researchers and graduate level students in the area of semiconductor materials, optoelectronics and devices as well as developers and engineers in the various application fields of UV emitters and detectors.

The Physics of Semiconductor Devices

The Physics of Semiconductor Devices
Author: R. K. Sharma
Publisher: Springer
Total Pages: 1299
Release: 2019-01-31
Genre: Technology & Engineering
ISBN: 3319976044

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This book disseminates the current knowledge of semiconductor physics and its applications across the scientific community. It is based on a biennial workshop that provides the participating research groups with a stimulating platform for interaction and collaboration with colleagues from the same scientific community. The book discusses the latest developments in the field of III-nitrides; materials & devices, compound semiconductors, VLSI technology, optoelectronics, sensors, photovoltaics, crystal growth, epitaxy and characterization, graphene and other 2D materials and organic semiconductors.

Multi-Band Effective Mass Approximations

Multi-Band Effective Mass Approximations
Author: Matthias Ehrhardt
Publisher: Springer
Total Pages: 337
Release: 2014-07-17
Genre: Mathematics
ISBN: 3319014277

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This book addresses several mathematical models from the most relevant class of kp-Schrödinger systems. Both mathematical models and state-of-the-art numerical methods for adequately solving the arising systems of differential equations are presented. The operational principle of modern semiconductor nano structures, such as quantum wells, quantum wires or quantum dots, relies on quantum mechanical effects. The goal of numerical simulations using quantum mechanical models in the development of semiconductor nano structures is threefold: First they are needed for a deeper understanding of experimental data and of the operational principle. Secondly, they allow us to predict and optimize in advance the qualitative and quantitative properties of new devices in order to minimize the number of prototypes needed. Semiconductor nano structures are embedded as an active region in semiconductor devices. Thirdly and finally, the results of quantum mechanical simulations of semiconductor nano structures can be used with upscaling methods to deliver parameters needed in semi-classical models for semiconductor devices, such as quantum well lasers. This book covers in detail all these three aspects using a variety of illustrative examples. Readers will gain detailed insights into the status of the multiband effective mass method for semiconductor nano structures. Both users of the kp method as well as advanced researchers who want to advance the kp method further will find helpful information on how to best work with this method and use it as a tool for characterizing the physical properties of semiconductor nano structures. The book is primarily intended for graduate and Ph.D. students in applied mathematics, mathematical physics and theoretical physics, as well as all those working in quantum mechanical research or the semiconductor / opto-electronic industry who are interested in new mathematical aspects.