Sequential Logic Testing and Verification

Sequential Logic Testing and Verification
Author: Abhijit Ghosh
Publisher: Springer Science & Business Media
Total Pages: 224
Release: 2012-12-06
Genre: Technology & Engineering
ISBN: 1461536464

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In order to design and build computers that achieve and sustain high performance, it is essential that reliability issues be considered care fully. The problem has several aspects. Certainly, considering reliability implies that an engineer must be able to analyze how design decisions affect the incidence of failure. For instance, in order design reliable inte gritted circuits, it is necessary to analyze how decisions regarding design rules affect the yield, i.e., the percentage of functional chips obtained by the manufacturing process. Of equal importance in producing reliable computers is the detection of failures in its Very Large Scale Integrated (VLSI) circuit components, caused by errors in the design specification, implementation, or manufacturing processes. Design verification involves the checking of the specification of a design for correctness prior to carrying out an implementation. Implementation verification ensures that the manual design or automatic synthesis process is correct, i.e., the mask-level description correctly implements the specification. Manufacture test involves the checking of the complex fabrication process for correctness, i.e., ensuring that there are no manufacturing defects in the integrated circuit. It should be noted that all the above verification mechanisms deal not only with verifying the functionality of the integrated circuit but also its performance.

Dynamics and Control of Multibody Systems

Dynamics and Control of Multibody Systems
Author: Perinkulam Sambamurthy Krishnaprasad
Publisher: American Mathematical Soc.
Total Pages: 488
Release: 1989
Genre: Mathematics
ISBN: 0821851047

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The study of complex, interconnected mechanical systems with rigid and flexible articulated components is of growing interest to both engineers and mathematicians. Recent work in this area reveals a rich geometry underlying the mathematical models used in this context. In particular, Lie groups of symmetries, reduction, and Poisson structures play a significant role in explicating the qualitative properties of multibody systems. In engineering applications, it is important to exploit the special structures of mechanical systems. For example, certain mechanical problems involving control of interconnected rigid bodies can be formulated as Lie-Poisson systems. The dynamics and control of robotic, aeronautic, and space structures involve difficulties in modeling, mathematical analysis, and numerical implementation. For example, a new generation of spacecraft with large, flexible components are presenting new challenges to the accurate modeling and prediction of the dynamic behavior of such structures. Recent developments in Hamiltonian dynamics and coupling of systems with symmetries has shed new light on some of these issues, while engineering questions have suggested new mathematical structures. These kinds of considerations motivated the organization of the AMS-IMS-SIAM Joint Summer Research Conference on Control Theory and Multibody Systems, held at Bowdoin College in August, 1988. This volume contains the proceedings of that conference. The papers presented here cover a range of topics, all of which could be viewed as applications of geometrical methods to problems arising in dynamics and control. The volume contains contributions from some of the top researchers and provides an excellent overview of the frontiers of research in this burgeoning area.

Microlithography

Microlithography
Author: Bruce W. Smith
Publisher: CRC Press
Total Pages: 770
Release: 2020-05-01
Genre: Technology & Engineering
ISBN: 1351643444

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The completely revised Third Edition to the bestselling Microlithography: Science and Technology provides a balanced treatment of theoretical and operational considerations, from fundamental principles to advanced topics of nanoscale lithography. The book is divided into chapters covering all important aspects related to the imaging, materials, and processes that have been necessary to drive semiconductor lithography toward nanometer-scale generations. Renowned experts from the world’s leading academic and industrial organizations have provided in-depth coverage of the technologies involved in optical, deep-ultraviolet (DUV), immersion, multiple patterning, extreme ultraviolet (EUV), maskless, nanoimprint, and directed self-assembly lithography, together with comprehensive descriptions of the advanced materials and processes involved. New in the Third Edition In addition to the full revision of existing chapters, this new Third Edition features coverage of the technologies that have emerged over the past several years, including multiple patterning lithography, design for manufacturing, design process technology co-optimization, maskless lithography, and directed self-assembly. New advances in lithography modeling are covered as well as fully updated information detailing the new technologies, systems, materials, and processes for optical UV, DUV, immersion, and EUV lithography. The Third Edition of Microlithography: Science and Technology authoritatively covers the science and engineering involved in the latest generations of microlithography and looks ahead to the future systems and technologies that will bring the next generations to fruition. Loaded with illustrations, equations, tables, and time-saving references to the most current technology, this book is the most comprehensive and reliable source for anyone, from student to seasoned professional, looking to better understand the complex world of microlithography science and technology.

Optical Imaging in Projection Microlithography

Optical Imaging in Projection Microlithography
Author: Alfred Kwok-Kit Wong
Publisher: SPIE Press
Total Pages: 280
Release: 2005
Genre: Technology & Engineering
ISBN: 9780819458292

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Here for the first time is an integrated mathematical view of the physics and numerical modeling of optical projection lithography that efficiently covers the full spectrum of the important concepts. Alfred Wong offers rigorous underpinning, clarity in systematic formulation, physical insight into emerging ideas, as well as a system-level view of the parameter tolerances required in manufacturing. Readers with a good working knowledge of calculus can follow the step-by-step development, and technologists can gather general concepts and the key equations that result. Even the casual reader will gain a perspective on the key concepts, which will likely help facilitate dialog among technologists.

Scientific and Technical Aerospace Reports

Scientific and Technical Aerospace Reports
Author:
Publisher:
Total Pages: 1044
Release: 1988
Genre: Aeronautics
ISBN:

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Lists citations with abstracts for aerospace related reports obtained from world wide sources and announces documents that have recently been entered into the NASA Scientific and Technical Information Database.

SIAM Journal on Control and Optimization

SIAM Journal on Control and Optimization
Author: Society for Industrial and Applied Mathematics
Publisher:
Total Pages: 854
Release: 1993
Genre: Control theory
ISBN:

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