Advances in X-ray Absorption Fine Structure Analysis

Advances in X-ray Absorption Fine Structure Analysis
Author: Zhongrui (jerry) Li
Publisher:
Total Pages: 400
Release: 2020-11-15
Genre:
ISBN: 9781925823882
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This book provides a comprehensive, theoretical, practical, and thorough guide to current X-ray absorption fine structure (XAFS) spectroscopy and modern applications. It contains the experimental and theoretical aspects of XAFS in 14 chapters based on recent developments in the XAFS approach to science and technology, describing the basic principles and theories, calculation methods, computer programs, advanced methodologies and techniques, experiments, data analysis and interpretation and applications. Among the broad XAFS subjects of synchrotron radiation applications, the book specifically covers EXAFS, XANES and NEXAFS, AXAFS, DAFS, XMCD, MEXAFS, XMLD, and X-ray natural dichroism (XNCD and XNLD). This book may serve as a reference book for researchers and technicians taking up synchrotron radiation application research and postgraduates majoring in the X-ray absorption spectroscopy field. It will provide the beginners with all the necessary information in the field of XAFS. Also, experienced users active in particular subfields of XAFS spectroscopies will learn in this book about the enormous potential of XAFS for other applications in physics, chemistry, biology, materials science and engineering, geo- and environmental science, etc. For more details, please visit https: //centralwestpublishing.com s book provides a comprehensive, theoretical, practical, and thorough guide to current X-ray absorption fine structure (XAFS) spectroscopy and modern applications. It contains the experimental and theoretical aspects of XAFS in 14 chapters based on recent developments in the XAFS approach to science and technology, describing the basic principles and theories, calculation methods, computer programs, advanced methodologies and techniques, experiments, data analysis and interpretation and applications. Among the broad XAFS subjects of synchrotron radiation applications, the book specifically covers EXAFS, XANES and NEXAFS, AXAFS, DAFS, XMCD, MEXAFS, XMLD, and X-ray natural dichroism (XNCD and XNLD).

Advances in X-Ray Analysis

Advances in X-Ray Analysis
Author: Gavin R. Mallett
Publisher: Springer
Total Pages: 544
Release: 1995-12-31
Genre: Science
ISBN: 9780306381096
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The papers presented in this volume of Advances in X-Ray Analysis were chosen from those presented at the Fourteenth Annual Conference on the Applications of X-Ray Analysis. This conference, sponsored by the Metallurgy Division of the Denver Research Institute, University of Denver, was held on August 24,25, and 26, 1965, at the Albany Hotel in Denver, Colorado. Of the 56 papers presented at the conference, 46 are included in this volume; also included is an open discussion held on the effects of chemical com bination on X-ray spectra. The subjects presented represent a broad scope of applications of X-rays to a variety of fields and disciplines. These included such fields as electron-probe microanalysis, the effect of chemical combination on X-ray spectra, and the uses of soft and ultrasoft X-rays in emission analysis. Also included were sessions on X-ray diffraction and fluor escence analysis. There were several papers on special topics, including X-ray topography and X-ray absorption fine-structure analysis. William L. Baun contributed considerable effort toward the conference by organizing the session on the effect of chemical combination on X-ray spectra fine structure. A special session was established through the excellent efforts of S. P. Ong on the uses and applica tions of soft X-rays in fluorescent analysis. We offer our sincere thanks to these men, for these two special sessions contributed greatly to the success of the conference.

Advances in X-Ray Analysis

Advances in X-Ray Analysis
Author: William M. Mueller
Publisher: Springer
Total Pages: 376
Release: 2012-04-18
Genre: Science
ISBN: 9781468474039
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It is interesting to observe the ever increasing versatility of X-ray analysis as evidenced by the wide range of application to the myriads of problems confronting the technological com munity, a versatility limited only by the imagination and inge nuity of the scientist, the designer of X-ray equipment, and the novice or student. Tomorrow's engineering alloys will undoubt edly be influenced by today's extremely low- and very high-tem perature X-ray research. New and continued insight into the basic architecture of crystalline materials is being achieved by studies of lattice imperfection, recrystallization habit, and phase transformation. Techniques for identification and analysis of minerals by X-ray diffraction and fluorescence are equally ame nable to pathological and physiological diagnosis. The experi mental setup of this month may well become an instrument for routine process control next month. And such developments occur so rapidly iIi so many different laboratories that it is difficult to keep abreast of this tidal wave of information. The dictates of this nation's economy and its struggle for technological supremacy demand a full awareness of the ac complishments of one's associates. Such awareness is most effectively obtained through personal contact. where the beginner can benefit from the experiences of the expert, the basic re searcher and the applied researcher can exchange views, and the creative research of each is nurtured by the sharing of mutual or associated problems.

X-ray Absorption Fine Structure for Catalysts and Surfaces

X-ray Absorption Fine Structure for Catalysts and Surfaces
Author: Yasuhiro Iwasawa
Publisher: World Scientific
Total Pages: 438
Release: 1996
Genre: Science
ISBN: 9789810223236
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X-ray absorption fine structure (XAFS) is a powerful technique in characterization of structures and electronic states of materials in many research fields including, e.g., catalysts, semiconductors, optical ingredients, magnetic materials, and surfaces. This characterization technique could be applied in a static or a dynamic state (in-situ condition). The XAFS can provide information that is not accessible by other techniques for characterization of materials, particularly catalysts and related surfaces. Furthermore, XAFS can provide a molecular-level approach to the study of reaction mechanisms for the understanding of catalysts and development of new catalysts. A number of synchrotron radiation facilities have been planned to be built in Asian countries in addition to the high-brilliant synchrotron radiation facilities under construction in the USA, Europe, and Japan. The applications of XAFS have now expanded to catalytic chemistry and engineering, surface science, organometallic chemistry, materials science, solid-state chemistry, geophysics, etc. This book caters to a wide range of researchers and students working in the domain or related topics.

Introduction to XAFS

Introduction to XAFS
Author: Grant Bunker
Publisher: Cambridge University Press
Total Pages: 269
Release: 2010-01-28
Genre: Science
ISBN: 1139485091
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X-ray absorption fine structure spectroscopy (XAFS) is a powerful and versatile technique for studying structures of materials in chemistry, physics, biology and other fields. This textbook is a comprehensive, practical guide to carrying out and interpreting XAFS experiments. Assuming only undergraduate-level physics and mathematics, the textbook is ideally suited for graduate students in physics and chemistry starting XAFS-based research. It contains concise executable example programs in Mathematica 7. Supplementary material available at www.cambridge.org/9780521767750 includes Mathematica code from the book, related Mathematica programs, and worked data analysis examples. The textbook addresses experiment, theory, and data analysis, but is not tied to specific data analysis programs or philosophies. This makes it accessible to a broad audience in the sciences, and a useful guide for researchers entering the subject.

X-Ray Absorption and X-Ray Emission Spectroscopy

X-Ray Absorption and X-Ray Emission Spectroscopy
Author: Jeroen A. van Bokhoven
Publisher: John Wiley & Sons
Total Pages: 896
Release: 2016-01-14
Genre: Science
ISBN: 1118844289
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During the last two decades, remarkable and often spectacularprogress has been made in the methodological and instrumentalaspects of x–ray absorption and emission spectroscopy. Thisprogress includes considerable technological improvements in thedesign and production of detectors especially with the developmentand expansion of large-scale synchrotron reactors All this hasresulted in improved analytical performance and new applications,as well as in the perspective of a dramatic enhancement in thepotential of x–ray based analysis techniques for the nearfuture. This comprehensive two-volume treatise features articlesthat explain the phenomena and describe examples of X–rayabsorption and emission applications in several fields, includingchemistry, biochemistry, catalysis, amorphous and liquid systems,synchrotron radiation, and surface phenomena. Contributors explainthe underlying theory, how to set up X–ray absorptionexperiments, and how to analyze the details of the resultingspectra. X-Ray Absorption and X-ray Emission Spectroscopy: Theory andApplications: Combines the theory, instrumentation and applications of x-rayabsorption and emission spectroscopies which offer uniquediagnostics to study almost any object in the Universe. Is the go-to reference book in the subject for all researchersacross multi-disciplines since intense beams from modern sourceshave revolutionized x-ray science in recent years Is relevant to students, postdocurates and researchers workingon x-rays and related synchrotron sources and applications inmaterials, physics, medicine, environment/geology, andbiomedical materials

Advances in X-Ray Analysis

Advances in X-Ray Analysis
Author: Gavin R. Mallett
Publisher: Springer Science & Business Media
Total Pages: 554
Release: 2013-11-21
Genre: Science
ISBN: 1468476335
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The papers presented in this volume of Advances in X-Ray Analysis were chosen from those presented at the Fourteenth Annual Conference on the Applications of X-Ray Analysis. This conference, sponsored by the Metallurgy Division of the Denver Research Institute, University of Denver, was held on August 24,25, and 26, 1965, at the Albany Hotel in Denver, Colorado. Of the 56 papers presented at the conference, 46 are included in this volume; also included is an open discussion held on the effects of chemical com bination on X-ray spectra. The subjects presented represent a broad scope of applications of X-rays to a variety of fields and disciplines. These included such fields as electron-probe microanalysis, the effect of chemical combination on X-ray spectra, and the uses of soft and ultrasoft X-rays in emission analysis. Also included were sessions on X-ray diffraction and fluor escence analysis. There were several papers on special topics, including X-ray topography and X-ray absorption fine-structure analysis. William L. Baun contributed considerable effort toward the conference by organizing the session on the effect of chemical combination on X-ray spectra fine structure. A special session was established through the excellent efforts of S. P. Ong on the uses and applica tions of soft X-rays in fluorescent analysis. We offer our sincere thanks to these men, for these two special sessions contributed greatly to the success of the conference.

X-ray Absorption Spectroscopy for the Chemical and Materials Sciences

X-ray Absorption Spectroscopy for the Chemical and Materials Sciences
Author: John Evans
Publisher: John Wiley & Sons
Total Pages: 226
Release: 2017-11-23
Genre: Technology & Engineering
ISBN: 1118676173
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A clear-cut introduction to the technique and applications of x-ray absorption spectroscopy X-ray Absorption Spectroscopy is being applied to a widening set of disciplines. Applications started with solid state physics and grew to materials science, chemistry, biochemistry and geology. Now, they cut across engineering materials, environmental science and national heritage — providing very detailed and useful information facilitating understanding and development of materials. This practical guide helps investigators choose the right experiment, carry it out properly and analyze the data to give the best reliable result. It gives readers insights to extract what they need from the world of large-scale experimental facilities like synchrotrons, which seem distant to many laboratory scientists. X-ray Absorption Spectroscopy for the Chemical and Materials Sciences seeks to educate readers about the strengths and limitations of the techniques, including their accessibility. Presented in six sections, it offers chapters that cover: an introduction to X-ray absorption fine structure XAFS; the basis of XAFS; X-ray sources; experimental methods; data analysis and simulation methods; and case studies. A no-nonsense introduction to the technique and applications of x-ray absorption spectroscopy Features Questions to support learning through the book Relevant to all working on synchrotron sources and applications in physics, materials, environment/geology and biomedical materials Four-color representation allows easy interpretation of images and data for the reader X-ray Absorption Spectroscopy for the Chemical and Materials Sciences is aimed at Masters-level and PhD students embarking on X-ray spectroscopy projects as well as scientists in areas of materials characterization.

Advances in X-ray Analysis

Advances in X-ray Analysis
Author:
Publisher:
Total Pages: 722
Release: 1993
Genre: Analytical chemistry
ISBN:
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